General SiPRO Presentation-5 PDF
General SiPRO Presentation-5 PDF
General SiPRO Presentation-5 PDF
2
Contents
3
1. Safety
4
2. Measurement - Overview: Definitions
5
2. Measurement - Overview: Definitions
Informal Definitions
� Profile
Cross-profile: how the strip
thickness varies across the
strip (at right angles to the
process direction)
� Flatness (“shape”)
Flatness measures the ability
of a cut strip to conform to a
flat horizontal surface
6
2. Measurement - Overview: Profile definitions
excessive
crown
negative
crown
w=0 w=
wmax
crown = Xc - (Xl + Xr) / 2
wedge = Xl - Xr
profile = Xp for w = 0 .... wmax d
relative profile = ( Xp - Xc) for w = 0 .... wmax
edge drop = d
7
2. Measurement - Principles
8
2. Measurement - Edge Detection & Apparent Thickness
Source 1 Source 2
Detector Surface
9
2. Measurement - XDM-USB Interface Module - Overview
10
2. Measurement - XDM-USB Interface Module
11
2. Measurement - XDM-USB Interface Module – Hardware
Connection
• The XDM-0x detector connects to the XDM03-USB device via the 18-
pin Molex connector - the pinout is as follows:
12
3. Main Components
EPOS
Colour
Main Printer
Electronic
Console Services
#1 #2 Boxes
Junction
Box
X-ray X-ray
Warning Source Source
Lamps
C-frame
Chiller
Calibration Unit
CVTs
13
3. Main Components --- C-frame
Motor Drive
Pyrometer
14
3.1 Top Arm
15
3.1.1
16
3.1.2. X-ray tube assembly
Lead Shield
Pre-collimator
Final Collimator
18
3.1.2 X-ray Safety Shutter
20
3.1.2 X-ray Final Collimator
21
3.1.3 Rotating (Chop) Shutter and Standards Magazines
AC Motor
Chop shutter sensor Closed Coupling Open
Shutter Shutter
Standards
Magazines
22
3.1.3 Rotating (Chop) Shutter
23
3.1.3 Rotating Shutters (Chop Shutter)
24
3.1.4 Standards Magazine (Internal Samples)
25
3.1.5 Scanning Pyrometer
SiproMeas SiproPyro
SiproSuper
SiproData
SiproDet
26
3.1.6 Top Arm Ancillary Parts
27
3.2 Back Arm
28
3.3 Bottom
2(c). Bottom
Arm Arm
29
3.3.1 Bottom Arm - X-ray Detector Array
30
3.3.1 Bottom Arm - X-ray Detector Array
Detector modules
Interface board
31
2(c). X-ray Detector
3.3 Bottom Arm Array
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3.3 Detector Module – XDM04
• 32 channels groups
• Sensors in Peltier
cooled Aluminium
housing
• Electronics board
• 22 bit A-D converters
• Memory
• PLD control
• Serial readout
• Peltier power bus bar
33
3.3 Detector Array
• Up to 20 modules in a
standard housing -
3840 mm detection
length
• No gaps
• Easy to change
sensors or modules
• Dry air purge
• Water cooling in trolley
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3.3 Bottom Arm Detector Sensor
8 scintillators per unit and 4
units per detector module
0.25mm
lead
shield
2.5mm
6mm
Multiplexing
Electronics
35
3.3 Detector Block Diagram
36
3.3 Detector Interface
37
3.3 2(c). Detector
Detector cooling
Cooling
scintillator &
diode hosing
Peltier
Heat
Water Flow
38
3.3 Detector Power Tray
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3.3 Data Transmission
• Each PCB has an address header which sets its logical position in the
array
• During measurement the charge from each diode is simultaneously
integrated for 4 milliseconds and then held for 1 millisecond whilst each
PCB digitises its 32 elements
• The module data is then sequentially read out to the host computer in
the next 5 milliseconds whilst the analogue part is collecting the following
4 milliseconds data
Det 1 transmit
40
4. Cooling
41
4. Cooling - Chiller
u A
42
4. Water and Air Services
u A
43
4. C-frame services
u A
44
4. Cooling Circuits
• Four Circuits
• X-Ray Tubes 1 & 2
• Air cooler
• Detector Tray
• Each Circuit
• Flow adjuster
• Visual indicator
• Flow sensor
• Filter
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4. Air Supplies & C-frame Cooling Water
46
4. Power Distribution Box
Door mounted push
buttons, switches and
relays for
•C-frame
movement
•E-stop
•Shutter isolator
47
4. Electrical Junction Box
48
4. Main Console
49
5. Bachmann M1
Bachmann M1
50
6. M1 and Main Computer: Basic Configuration
51
6.
6. Major
Major I/O
I/O Functions
Functions
52
6. Major I/O Functions
53
6. Major I/O Functions
54
6. Major I/O Functions
55
6. Major I/O Functions
56
6. Major I/O Functions
57
7. Internal Calibration
160000
140000
120000
100000
80000
60000
40000
20000
0
0 1000 2000 3000 4000 5000 6000 7000 8000 9000 10000
• Easy in principal
• Measure detector signals for known thicknesses.
• Curve fit and interpolate
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7. Internal Calibration – Source 1
160000
140000
120000
infinity
zero
100000
I390
I800
I1390
80000
I3000
I4390
I6000
60000
I7390
I8000
40000
20000
0
0 50 100 150 200 250 300 350 400 450 500
59
7. Internal
6. Major I/OCalibration
Functions– Source 2
7. Major I/O Functions
140000
120000
100000
infinity
zero
I390
80000 I800
I1390
I3000
60000 I4390
I6000
I7390
I8000
40000
20000
0
0 50 100 150 200 250 300 350 400 450 500
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7. Internal Calibration
61
7. External Calibration
62
7. Calibration Samples
80mm
X.Xmm
Standard, 70x70mm
100mm
Aperture, 60x60mm
XXXXX-XX
Orientation corner, 12x12mm
63
7. External Calibration
64
7. External Calibration Data
External Cal. R1 S1
200000
180000 det_no
infinity
zero
160000
I800
I1200
140000
I1600
I2400
120000
I3600
Sig. Level
I4800
100000
I7400
I9600
80000
E722
E1182
60000
E1691
E2463
40000
E3694
E7450
20000
E9613
0
0 32 64 96 128 160 192 224 256 288 320 352 384 416 448 480 512
Det. No.
65
7. Standardise
66
7. Calibration Modes and Uses
67
8. Profile Measurement
Source 1 Source 2
Detector Surface
68
8. Edge Scatter
Source
Strip
Detectors
69
8. Thickness scatter
Detectors
70
8. Height scatter
Strip
Detectors
71
8. Strip scatter
X-ray
source
Strip
Detectors
72
9. Alloy Compensation
Alloy Compensation
73
10. Temperature Compensation
T thinner to X-rays
E
M
P.
C • Temperature Index (TI) is analogous
O
M
P.
to AI
I
N
D
E
• TI equals twice the linear expansion
X
T
coefficient
I
74
11.Supervisor Applications & Screens
Supervisor Screens
75
11. Supervisory Application
76
12. Shape
77
12. Angle Measurement
If the strip is flat across its width both source thickness measurements
are the same (A).
78
12. Contour From Angle
79
12. Contour Calculations
1 2
80
12. Contour Corrections
81
12. Shape Measurement
82
12. Calculation of Shape
540
535
530
525
520
515 dS
510
505
500
0 1 2 3 4 5 6 Process
7 direction
8 9 10
� �L � �S �
I � � � � 10 � � � 1� � 105
5
� L� �L �
83
12. Symmetric and Asymmetric Shape
• Symmetric Shape
• Difference between centre and mean of
edges
• Positive means centre buckle
• Negative means edge wave
• Asymmetric Shape
• Difference between two edges
• Both easily visualised
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Thanks for your attention !
Questions ?
85