Variables control chart

NANI KURNIATI, PhD

DEPARTMENT OF INDUSTRIAL AND SYSTEM ENGINEERING

INSTITUT TEKNOLOGI SEPULUH NOPEMBER (ITS)

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Statistical Review
 Statistical Review
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• Based on the source

– Primary
– Secondary

• Based on the characteristics

– Quantitative – Variables
• States the quantity of certain object, can be expressed in a certain numerical
scale.
• Measurable
• Example : waiting time (in minute) before a service begins
– Qualitative (categorical) – Attributes
• Does not express any quantitative interpretation. It can only be classified.
• Countable
• Example : field/area of expertise mostly occupied by the graduates of IE-ITS
• Based on the method to obtain the data
– Discrete: a data of well defined value, obtained by counting. For example a number
of customers in an hour.
– Continuous: one can take a value between any other two values, obtained by
measuring the objects. Example: indoor temperature, body weight, height.
 Introduction (2)
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• Control Charts help us to determine whether a process is in a state

of statistical control or out-of-control.
• To monitor output, we use a control chart
– we check things like the mean, range, standard deviation
• To monitor a process, we typically use two control charts
– mean (or some other central tendency measure)
– variation (typically using range or standard deviation)
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Introduction (3)
 Introduction (3)
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• Variable is a single quality characteristic, can be measured

(measurable). Examples: length, size, weight, height, time, velocity.
• When working with variables, we should monitor both the mean
value of the characteristic and the variability associated with the
characteristic.
• variables CC are constructed to monitor mean and variability.
• Common chart to monitor the mean is called x ത chart.
• Common charts to monitor the variability : R chart and s chart.
 Example
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(a) Mean and standard deviation at nominal levels

(b) Process mean µ1 > µ2
(c) Process standard deviation 1 > 2
 How to develop control chart?
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Define the problem

Select a quality characteristic to be measured

Choose a subgroup to be sampled

Collect the data

Determine trial centreline

Determine trial control limits

Determining an alternative value for the standard

deviation
 Control Charts for x
ത and R
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n = size of the sample ( sometimes called a subgroup ) chosen at a point in time

m = number of samples selected
xi = the observation in sample i
x = average of the observations in the (i − th) sample (where, i = 1, 2,..., m)
x = grand average or “average of the averages"
Ri = range of the observations in the (i − th) sample
R = average range for all m samples
 = the true process mean
 = is the true process standard deviation
 Control Charts for x
ത and R
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Statistical Basis of the Charts

• Assume the quality characteristic of interest is normally
distributed with mean , and standard deviation, .
• If x1, x2, …, xn is a sample of size n, then he average of this
sample is
x1 + x 2 +  + x n
x=
n
• x is normally distributed with mean, , and standard deviation,

x = / n
 Control Charts for x
ത and R
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• The probability is 1 -  that any sample mean will fall between


 + Z / 2 x =  + Z / 2 upper control limits
n
and
 lower control limits
 − Z / 2 x =  − Z / 2
n
• Remember about the general equations for CC

Center Line =  w
Control limit =  w  L w
 Control Charts for x
ത and R
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Control Limits for the x chart

Center Line = x
x1 + x 2 +  + x m
x= Control limit = x  L x
m

Center Line = R UCL = D4 R

R1 + R2 +  + Rm
R= Center Line = R
m Control limit = R  L R
LCL = D3 R

• A2, D3, D4 is found in Appendix VI for various values of n.

 Control Charts for x
ത and R
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Estimating the Process Standard Deviation

• The random variable W = R/ is called relative range.
• The parameters of distribution of W are a function of the sample size n.
• The mean of W is d2.
• The process standard deviation can be estimated using a function of the sample
average range. The unbiased estimator of  is ˆ = R d 2
• If we use x as an estimator of µ and ˆ as an estimator of , then the
parameter of the x chart are

Center Line = x
Control limit =
  R d2 R
x  L x = x  3 x = x  3 = x 3 = x 3 = x 3
n n n d2 n

UCL = x + A2 R
3
• If we define = A2 then Center Line = x
d2 n
LCL = x − A2 R
 Control Charts for x
ത and R
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• Now consider the R chart. The center line will be R .

• To determine the control limits, we need an estimate of R .

Assuming that the quality characteristic is normally distributed,
can be found from the distribution of the relative range W =
R/ . The standard deviation of W, say d3 , is a known function
of n. Thus
R=W

• the standard deviation of R is R = d3 

 Control Charts for x
ത and R
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• Since  is unknown, we may estimate R by

• Consequently, the parameters of the R chart with usual three

sigma control limits are

• If we let
 Control Charts for x
ത and R (11)
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Estimating Process Capability

• The x-bar and R charts give information about the capability of
the process relative to its specification limits.
• Assumes a stable process.
• We can estimate the fraction of nonconforming items for any
process where specification limits are involved.
• Assume the process is normally distributed, and x is normally
distributed, the fraction nonconforming can be found by
solving:
P(x < LSL) + P(x > USL)
 Control Charts for x
ത and R (12)
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Process-Capability Ratios (Cp)

• Used to express process capability.
• For processes with both upper and lower control limits,
Use an estimate of  if it is unknown.

USL − LSL
Cp =
6

• If Cp > 1, then a low # of nonconforming items will be produced.

• If Cp = 1, (assume norm. dist) then we are producing about
0.27% nonconforming.
• If Cp < 1, then a large number of nonconforming items are being
produced.
 Control Charts for x
ത and R (13)
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Process-Capability Ratios (Cp)

• The percentage of the specification band that the process uses
up is denoted by

 1 
P̂ =  100%
C 
 p
**The Cp statistic assumes that the process mean is centered at
the midpoint of the specification band – it measures potential
capability.
 Case Study 1
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A hard bake process is used in conjunction with photolithography in

semiconductor manufacturing. We wish to establish statistical control of
the flow width of the resist in this process using xത and R charts. Twenty
five samples, each of size five wafers, have been taken when we think
the process is in control. The interval of time between samples or
subgroups is one hour. The flow width measurement data (in microns)
from the samples are shown in table 5.1
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Case Study 1
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Solution - Case Study 1

 Output Minitab - Case Study 1
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 Estimating Process Capability - Case Study 1
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Where the value of d2 for samples of size five is found in Appendix VI. The
specification limits on flow width are 1.50 ± 0.50 microns. The control chart
data may be used to describe the capability of the process to produce
wafers relative to this specifications. Assuming that flow width is a normally
distributed random variable, with mean 1.5056 and standard deviation
0.1398, we may estimate the fraction of non-conforming wafers produced as
 Process Capability and Process Capability Ratio -
Case Study 1
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 Process Fallout and the Process Capability Ratio
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Phase II – Case Study 1

 Phase II – Case Study 1
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Revision of control limits and center lines

 Phase II – Case Study 1
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Output minitab
 Control limits, specification limits, and natural
tolerance limits
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• Control limits are functions of

the natural variability of the
process
• Natural tolerance limits
represent the natural
variability of the process
(usually set at 3-sigma from
the mean)
• Specification limits are
determined by
developers/designers.
• There is no mathematical
relationship between control
limits and specification limits.
 Rational Subgroups
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• X bar chart monitors the between sample variability

• R chart monitors the within sample variability.
• The estimate of  reflects only within sample variability, so it is not
correct to estimate  based on the usual quadratic estimator.
 Chart Based on Standard Values
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It is customary to define the constants D1 = d2 – 3d3

D2 = d2 + 3d3
 Interpretation ofx
ത and R chart
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 The Operating Characteristic Function
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Where Ф denotes the standard normal cumulative distribution

function. Suppose that we are using an xbar chart with L = 3 (the
usual three sigma limits), the sample size n=5, we wish to
determine the probability of detecting a shift to µ1 = µ0 + 2  on the
first sample following the shift. Then we have

This is the β risk, or the probability of not detecting such a shift.

The probability that such a shift will be detected on the first
subsequent sample is 1- β = 1 – 0.0708 = 0.9292
 The Average Run Length for the x
ത Chart
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• For any Shewhart control chart, we have noted previously that the ARL
can be expressed as
 Average Time to Signal
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• The average time to signal is the number of time periods that occur
until a signal is generated on the control chart. If samples are taken at
equally spaced intervals of time h, then the average time to signal or
ATS is

• It may also be useful to express the ARL in terms of the expected

number of individual units sampled , I , rather than the number of
samples taken to detect a shift. If the sample size is n, the relationship
between I and ARL is
 Control Chart forx
ത and S
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• Although xത and R charts are widely used, it is occasionally describe to

estimate the process standard deviation directly instead of indirectly
through the use of the range R.
• This lead to control charts for xത and s, where s is the sample standard
deviation. Generally, xത and s charts are preferable to their more
familiar counterparts, xത and R charts when either :
1. The sample size n is moderately large, n > 10 or 12.
2. The sample size n is variable.
 Construction ofx
ത and S Charts
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• If the 2 is the unknown variance of a probability distribution, then an

unbiased estimator of 2 is the sample variance.

• If no standard is given for , then it must be estimated by analyzing

past data. Suppose that m preliminary samples are available, each of
size n, and let si be the standard deviation of the i-th sample. The
average of the m standard deviation
 Construction ofx
ത and S Charts (2)
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ҧ 4 is an unbiased estimator of  . Therefore, the

• The statistic 𝑠/c
parameters of the s chart would be

• We usually define the constants

 Construction ofx
ത and S Charts (3)
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• Consequently, we may write the parameters of the s chart as

• Note that B4 = B6/c4 and B3 = B5/c4

 Construction ofx
ത and S Charts (3)
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Case Study 2
 Solution - Case Study 2
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The grand average and the average standard deviation are

Consequently, the parameters for the xത chart are

and for the s chart

 Control Charts - Case Study 2
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 Estimation of  - Case Study 2
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We can estimate the process standard deviation using the fact that s/c4 is
an unbiased estimate of . Therefore, since c4 = 0.9400 for sample size 5,
out estimate of the process standard deviation is

𝑠ҧ
𝜎ො =
𝑐4
0.0094
= = 0.01
0.9400
 The ഥx and s Control Charts with Variable Sample Size
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Study 3
Case
 Solution - Case Study 3
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Consider the data in Table 5.4 which is a modification of the piston ring data
used in Case Study 2. Note that the sample sizes vary from n = 3 to n = 5.
Use the procedure decribed before to set up the x bar and s control chart.
 Control Charts - Case Study 3
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Therefore the control limits for xത chart are

And for s chart

 Output Minitab - Case Study 3
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 The Shewhart Control Chart for Individual Measurement
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There are many situations in which the sample size used for process
monitoring is n = 1, that is, the sample consists of an individual unit. Some
examples of these situations are as follows:
1. Automated inspection and measurement technology is used, and every
unit manufactured is analysed so there is no basis for rational
subgrouping.
2. Data comes available relatively slowly, and it is inconvenient to allow
sample sizes of n > 1 to accumulate before analysis. The long interval
between observations will cause problems with rational subgrouping.
This occurs frequently in both manufacturing and non-manufacturing
situations.
3. Repeat measurements on the process differ only because of laboratory
or analysis erros, as in many chemical processes.
4. Multiple measurements are taken on the same unit of product, such as
measuring oxide thickness at several different locations on a wafer in
semiconductor manufacturing.
5. etc
 The Shewhart Control Chart for Individual Measurement (2)
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Case Study 4
 Solution - Case Study 4
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Viskositas cat primer pesawat merupakan karakteristik mutu

penting. Produk ini diproduksi dalam batch, dan karena setiap batch
membutuhkan waktu beberapa jam untuk memproduksi, tingkat produksi
terlalu lambat untuk memungkinkan subkelompok rasional ukuran lebih
besar dari satu. Viskositas dari 20 batch sebelumnya disajikan pada tabel 5-6.

Untuk mengatur peta kendali untuk pengamatan individu, diketahui

bahwa rata-rata sampel dari 20 pembacaan viskositas x bar = 34,088 dan
bahwa rata-rata moving range dari dua pengamatan adalah MR = 0,573.
untuk mengatur berbagai moving range chart, kita gunakan D3 dan D4 = 0 =
3,267 untuk n = 2. Oleh karena itu, berbagai moving range chart memiliki
garis tengah MR = 0,5726, LCL 0 =, dan UCL = D4 MR = (3,267) 0,5726 =
1,871. peta kendali (dari minitab) ditunjukkan pada Gambar 5-19b.
Perhatikan bahwa titik untuk sampel 4 berada di luar kendali.
 Solution - Case Study 4
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Untuk peta kendali untuk pengukuran individu, parameter yaitu:

jika moving range

sebesar n = 2
pengamatan
digunakan, maka d2
= 1,128. untuk data
dalam tabel 5-6 kita
memiliki
 Control Chart- Case Study 4
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 Phase II Operation and Interpretation of the Chart –
Case Study 4
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 Phase II Operation and Interpretation of the Chart –
Case Study 4
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 Phase II Operation and Interpretation of the Chart –
Case Study 4
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 Average Run Length
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- Crowder (1987b) menunjukkan bahwa ARL0 individu gabungan dan chart

moving-range dengan batas 3-sigma konvensional yang pada umumnya
jauh lebih kecil daripada ARL0 (= 370) sebesar standard Shewhart grafik
pengendali

- Kemampuan individu untuk mendeteksi pergeseran kecil sangat buruk,

Bukannya mempersempit batas 3-sigma, pendekatan yang tepat untuk
mendeteksi perubahan kecil adalah jumlah-kumulatif atau secara grafik
kendali eksponensial weighted moving-average (Bab 8)
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Case Study 5