The document contains settings for distance protection relay device including:
- Substation and bay details where device is installed
- Device information like manufacturer, type, ratings
- Impedance and time settings for 8 zones for line protection
- Test results showing fault locations and impedances cleared within set times
The document contains settings for distance protection relay device including:
- Substation and bay details where device is installed
- Device information like manufacturer, type, ratings
- Impedance and time settings for 8 zones for line protection
- Test results showing fault locations and impedances cleared within set times
The document contains settings for distance protection relay device including:
- Substation and bay details where device is installed
- Device information like manufacturer, type, ratings
- Impedance and time settings for 8 zones for line protection
- Test results showing fault locations and impedances cleared within set times
The document contains settings for distance protection relay device including:
- Substation and bay details where device is installed
- Device information like manufacturer, type, ratings
- Impedance and time settings for 8 zones for line protection
- Test results showing fault locations and impedances cleared within set times
dst: . . Test Object - Device Settings . . . Substation/Bay: Substation: 220/66/11KV KPTCL SS Substation address: CHANPATNA Bay: 66KV BEVUR LINE Bay address: 609 . . . Device: Name/description: REL670 V1.1 IEC Manufacturer: ABB Device type: REL670 V1.1 Device address: 1 Serial/model number: I1837037 Additional info 1: Line A Additional info 2: Distance Protection . . . Nominal Values: f nom: 50.00 Hz Number of phases: 3 V nom (secondary): 110.0 V V primary: 66.00 kV I nom (secondary): 1.000 A I primary: 400.0 A . . . Residual Voltage/Current Factors: VLN / VN: 1.732 IN / I nom: 1.000 . . . Limits: V max: 200.0 V I max: 50.00 A . . . Debounce/Deglitch Filters: Debounce time: 3.000 ms Deglitch time: 0.00 s . . . Overload Detection: Suppression time: 50.00 ms . . . Other Device Properties: Drop-out time: 20.00 ms
Test Object - Other RIO Functions
. CB Configuration Description Name Value CB trip time CB trip time 50.00 ms CB close time CB close time 100.00 ms Times for 52a, 52b in percent of CB time 52a, 52b % of CB 20.00 %
Test Object - Distance Settings
. . . . System parameters: Line length: 23.55 Ω Line angle: 78.63 ° PT connection: at line CT starpoint: Dir. line Impedance correction no 1A/I nom: Impedances in primary yes values: . . . . Tolerances: Tol. T rel.: 2.000 % Tol. T abs. +: 115.0 ms Tol. T abs. -: 115.0 ms Tol. Z rel.: 2.000 % Tol. Z abs.: 50.00 mΩ . . . . Grounding factor: kL mag.: 0.000000 kL angle: 0.000000° Separate arc resistance: no
Zone Settings: Label Type Fault loop Trip time Tol. T rel Tol. T abs+ Tol. T abs- Tol. Z rel. Tol. Z abs Z1LL Tripping L-L 24.00 ms 2.000 % 115.0 ms 115.0 ms 2.000 % 1.354 Ω Z2LL Tripping L-L 374.0 ms 2.000 % 115.0 ms 115.0 ms 2.000 % 1.627 Ω Z3LL Tripping L-L 1.024 s 2.000 % 115.0 ms 115.0 ms 2.000 % 2.023 Ω Z4LL Tripping L-L 524.0 ms 2.000 % 115.0 ms 115.0 ms 2.000 % 600.7 mΩ Z1LN Tripping L-E 24.00 ms 2.000 % 115.0 ms 115.0 ms 2.000 % 1.572 Ω Z2LN Tripping L-E 374.0 ms 2.000 % 115.0 ms 115.0 ms 2.000 % 1.955 Ω Z3LN Tripping L-E 1.024 s 2.000 % 115.0 ms 115.0 ms 2.000 % 2.581 Ω Z4LN Tripping L-E 524.0 ms 2.000 % 115.0 ms 115.0 ms 2.000 % 1.022 Ω PHSLL Starting L1-L2 +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 1.105 Ω PHSLL Starting L2-L3 +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 1.105 Ω PHSLL Starting L3-L1 +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 1.105 Ω PHSLLL Starting L1-L2-L3 +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 1.296 Ω PHSLN Starting L-E +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 3.074 Ω Load non trip. L-E n/a n/a n/a n/a 2.000 % 1.600 Ω encroachme nt forward LN Load non trip. L-E n/a n/a n/a n/a 2.000 % 1.600 Ω encroachme nt reverse LN Load non trip. L1-L2 n/a n/a n/a n/a 2.000 % 1.386 Ω encroachme nt forward LL Load non trip. L1-L2 n/a n/a n/a n/a 2.000 % 1.386 Ω encroachme nt reverse LL Load non trip. L2-L3 n/a n/a n/a n/a 2.000 % 1.386 Ω encroachme nt forward LL Load non trip. L2-L3 n/a n/a n/a n/a 2.000 % 1.386 Ω encroachme nt reverse LL Load non trip. L3-L1 n/a n/a n/a n/a 2.000 % 1.386 Ω encroachme nt forward LL Load non trip. L3-L1 n/a n/a n/a n/a 2.000 % 1.386 Ω encroachme nt reverse LL Load non trip. L1-L2-L3 n/a n/a n/a n/a 2.000 % 1.600 Ω encroachme nt forward LLL Load non trip. L1-L2-L3 n/a n/a n/a n/a 2.000 % 1.600 Ω encroachme nt reverse LLL Z3LL Starting L-L +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 2.023 Ω Z4LL Starting L-L +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 600.7 mΩ Z3LN Starting L-E +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 2.581 Ω Z4LN Starting L-E +∞ s 2.000 % 115.0 ms 115.0 ms 2.000 % 1.022 Ω X/Ω
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Linked XRIO References
Reference Name Unit Value XRIO Path RIO.DEVICE.NOMINALVALUES.INOM In 1.00 A RIO/Device/Nominal Values/In RIO.DEVICE.NOMINALVALUES.VNO V_nom 110.00 V RIO/Device/Nominal Values/V nom M
Test Settings . Test model: Test model: constant test current ITest: 2.000 A Allow reduction of yes ITest/VTest: . Fault Inception: Mode: random Angle: n/a DC-offset: no . Times: Prefault: 1.000 s Max. fault: 1.100 s Postfault: 500.0 ms Time reference: fault inception . Other: CB simulation: off Extended zones: not active Switch off at zero yes crossing:
Test Results Shot Test: Fault Type L1-E |Z| Phi t nom t act. Dev. ITest Result 18.60 Ω 78.63 ° 24.00 ms 15.70 ms -34.58 % 2.000 A Passed 39.24 Ω -10.00 ° 24.00 ms 24.30 ms 1.25 % 1.942 A Passed 33.33 Ω 78.63 ° 374.0 ms 374.0 ms 0% 2.000 A Passed 58.18 Ω 30.00 ° 374.0 ms 378.0 ms 1.069 % 1.310 A Passed 55.97 Ω 78.63 ° 1.024 s 1.027 s 0.293 % 1.362 A Passed 78.21 Ω 42.99 ° 1.024 s 1.026 s 0.1758 % 974.4 mA Passed 3.004 Ω -101.37 ° 524.0 ms 513.9 ms -1.927 % 2.000 A Passed 30.19 Ω -175.13 ° 524.0 ms 524.0 ms 0% 2.000 A Passed 61.70 Ω 78.63 ° no trip no trip n/a 1.235 A Passed 7.596 Ω -101.37 ° no trip no trip n/a 2.000 A Passed X/Ω
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Shot Test: Fault Type L2-E
|Z| Phi t nom t act. Dev. ITest Result 18.60 Ω 78.63 ° 24.00 ms 12.90 ms -46.25 % 2.000 A Passed 46.29 Ω 20.00 ° 24.00 ms 24.50 ms 2.083 % 1.646 A Passed 39.24 Ω -10.00 ° 24.00 ms 24.20 ms 0.8333 % 1.942 A Passed 33.33 Ω 78.63 ° 374.0 ms 373.1 ms -0.2406 % 2.000 A Passed 58.18 Ω 30.00 ° 374.0 ms 376.2 ms 0.5882 % 1.310 A Passed 55.97 Ω 78.63 ° 1.024 s 1.026 s 0.1758 % 1.362 A Passed 78.21 Ω 42.99 ° 1.024 s 1.026 s 0.2246 % 974.4 mA Passed 3.004 Ω -101.37 ° 524.0 ms 515.9 ms -1.546 % 2.000 A Passed 30.19 Ω -175.13 ° 524.0 ms 527.1 ms 0.5916 % 2.000 A Passed 61.70 Ω 78.63 ° no trip no trip n/a 1.235 A Passed 7.596 Ω -101.37 ° no trip no trip n/a 2.000 A Passed X/Ω
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Shot Test: Fault Type L3-E
|Z| Phi t nom t act. Dev. ITest Result 18.60 Ω 78.63 ° 24.00 ms 13.60 ms -43.33 % 2.000 A Passed 46.29 Ω 20.00 ° 24.00 ms 25.70 ms 7.083 % 1.646 A Passed 39.24 Ω -10.00 ° 24.00 ms 26.00 ms 8.333 % 1.942 A Passed 33.33 Ω 78.63 ° 374.0 ms 374.3 ms 0.0802 % 2.000 A Passed 58.18 Ω 30.00 ° 374.0 ms 375.4 ms 0.3743 % 1.310 A Passed 55.97 Ω 78.63 ° 1.024 s 1.026 s 0.2344 % 1.362 A Passed 78.21 Ω 42.99 ° 1.024 s 1.026 s 0.1465 % 974.4 mA Passed 3.004 Ω -101.37 ° 524.0 ms 515.7 ms -1.584 % 2.000 A Passed 30.19 Ω -175.13 ° 524.0 ms 524.8 ms 0.1527 % 2.000 A Passed 61.70 Ω 78.63 ° no trip no trip n/a 1.235 A Passed 7.596 Ω -101.37 ° no trip no trip n/a 2.000 A Passed X/Ω
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Shot Test: Fault Type L1-L2
|Z| Phi t nom t act. Dev. ITest Result 10.63 Ω 78.63 ° 24.00 ms 14.60 ms -39.17 % 2.000 A Passed 39.79 Ω 12.94 ° 24.00 ms 24.30 ms 1.25 % 1.659 A Passed 38.33 Ω -10.00 ° 24.00 ms 23.50 ms -2.083 % 1.722 A Passed 18.94 Ω 78.63 ° 374.0 ms 367.2 ms -1.818 % 2.000 A Passed 50.00 Ω 20.00 ° 374.0 ms 377.0 ms 0.8021 % 1.320 A Passed 33.33 Ω 78.63 ° 1.024 s 1.027 s 0.2832 % 1.980 A Passed 60.74 Ω 30.00 ° 1.024 s 1.026 s 0.1758 % 1.087 A Passed 2.724 Ω -150.00 ° 524.0 ms 525.0 ms 0.1908 % 2.000 A Passed 16.67 Ω -180.00 ° 524.0 ms 527.2 ms 0.6107 % 2.000 A Passed 38.24 Ω 78.63 ° no trip no trip n/a 1.726 A Passed 3.989 Ω -101.37 ° no trip no trip n/a 2.000 A Passed X/Ω
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Shot Test: Fault Type L2-L3
|Z| Phi t nom t act. Dev. ITest Result 10.63 Ω 78.63 ° 24.00 ms 16.80 ms -30 % 2.000 A Passed 39.79 Ω 12.94 ° 24.00 ms 25.80 ms 7.5 % 1.659 A Passed 38.33 Ω -10.00 ° 24.00 ms 26.00 ms 8.333 % 1.722 A Passed 18.94 Ω 78.63 ° 374.0 ms 367.1 ms -1.845 % 2.000 A Passed 50.00 Ω 20.00 ° 374.0 ms 375.3 ms 0.3476 % 1.320 A Passed 33.33 Ω 78.63 ° 1.024 s 1.028 s 0.4297 % 1.980 A Passed 60.74 Ω 30.00 ° 1.024 s 1.026 s 0.1465 % 1.087 A Passed 2.724 Ω -150.00 ° 524.0 ms 525.7 ms 0.3244 % 2.000 A Passed 16.67 Ω -180.00 ° 524.0 ms 525.3 ms 0.2481 % 2.000 A Passed 38.24 Ω 78.63 ° no trip no trip n/a 1.726 A Passed 3.989 Ω -101.37 ° no trip no trip n/a 2.000 A Passed X/Ω
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Shot Test: Fault Type L3-L1
|Z| Phi t nom t act. Dev. ITest Result 10.63 Ω 78.63 ° 24.00 ms 14.60 ms -39.17 % 2.000 A Passed 39.79 Ω 12.94 ° 24.00 ms 24.90 ms 3.75 % 1.659 A Passed 38.33 Ω -10.00 ° 24.00 ms 27.00 ms 12.5 % 1.722 A Passed 18.94 Ω 78.63 ° 374.0 ms 373.2 ms -0.2139 % 2.000 A Passed 50.00 Ω 20.00 ° 374.0 ms 377.7 ms 0.9893 % 1.320 A Passed 33.33 Ω 78.63 ° 1.024 s 1.029 s 0.4785 % 1.980 A Passed 60.74 Ω 30.00 ° 1.024 s 1.027 s 0.2539 % 1.087 A Passed 2.724 Ω -150.00 ° 524.0 ms 524.9 ms 0.1718 % 2.000 A Passed 16.67 Ω -180.00 ° 524.0 ms 524.4 ms 0.0763 % 2.000 A Passed 38.24 Ω 78.63 ° no trip no trip n/a 1.726 A Passed 3.989 Ω -101.37 ° no trip no trip n/a 2.000 A Passed X/Ω
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Shot Test: Fault Type L1-L2-L3
|Z| Phi t nom t act. Dev. ITest Result 10.63 Ω 78.63 ° 24.00 ms 14.70 ms -38.75 % 2.000 A Passed 39.79 Ω 12.94 ° 24.00 ms 65.20 ms 171.7 % 1.915 A Passed 38.33 Ω -10.00 ° 24.00 ms 66.30 ms 176.3 % 1.988 A Passed 18.94 Ω 78.63 ° 374.0 ms 365.9 ms -2.176 % 2.000 A Passed 50.00 Ω 20.00 ° 374.0 ms 415.3 ms 11.04 % 1.524 A Passed 33.33 Ω 78.63 ° 1.024 s 1.067 s 4.199 % 2.000 A Passed 60.74 Ω 30.00 ° 1.024 s 1.048 s 2.344 % 1.255 A Passed 2.724 Ω -150.00 ° 524.0 ms 526.0 ms 0.3817 % 2.000 A Passed 16.67 Ω -180.00 ° 524.0 ms 523.9 ms -0.0191 % 2.000 A Passed 38.24 Ω 78.63 ° no trip no trip n/a 1.993 A Passed 3.989 Ω -101.37 ° no trip no trip n/a 2.000 A Passed X/Ω
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Shot Details: . Parameters: Fault Type: L1-L2-L3 | Z |: 3.989 Ω Phi: -101.37 ° R: -786.3 mΩ X: -3.911 Ω ITest: 2.000 A . Results: t act.: no trip Assessment: Passed t nom: no trip Dev.: n/a t min: no trip t max: no trip
. Fault Quantities (natural): VL1: 7.979 V 0.00 ° VL2: 7.979 V -120.00 ° VL3: 7.979 V 120.00 ° IL1: 2.000 A 101.37 ° IL2: 2.000 A -18.63 ° IL3: 2.000 A 221.37 ° VFault: 7.979 V 0.00 ° IFault: 2.000 A 101.37 ° . Cursor Data Time Signal Value Cursor 1 0.00 s <none> n/a Cursor 2 1.100 s <none> n/a C2 - C1 1.100 s n/a
