The document details the testing of the REF615 device at the WZPDCL 33/11kV Substation, focusing on device settings and overcurrent parameters. The test, conducted using the OMICRON Overcurrent module, included various shot tests with results indicating that all 12 test points passed successfully. Key parameters such as nominal values, limits, and test settings are outlined, confirming the device's operational integrity.
The document details the testing of the REF615 device at the WZPDCL 33/11kV Substation, focusing on device settings and overcurrent parameters. The test, conducted using the OMICRON Overcurrent module, included various shot tests with results indicating that all 12 test points passed successfully. Key parameters such as nominal values, limits, and test settings are outlined, confirming the device's operational integrity.
The document details the testing of the REF615 device at the WZPDCL 33/11kV Substation, focusing on device settings and overcurrent parameters. The test, conducted using the OMICRON Overcurrent module, included various shot tests with results indicating that all 12 test points passed successfully. Key parameters such as nominal values, limits, and test settings are outlined, confirming the device's operational integrity.
The document details the testing of the REF615 device at the WZPDCL 33/11kV Substation, focusing on device settings and overcurrent parameters. The test, conducted using the OMICRON Overcurrent module, included various shot tests with results indicating that all 12 test points passed successfully. Key parameters such as nominal values, limits, and test settings are outlined, confirming the device's operational integrity.
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EF TEST 11KV IN-1:
. . Test Object - Device Settings . . . Substation/Bay: Substation: WZPDCL 33/11kV Substation Substation address: KHALISHPUR Bay: 11kV IN-1 Bay address: . . . Device: Name/description: REF615 Manufacturer: ABB Device type: OC & EF Device address: Serial/model number: Additional info 1: Additional info 2: . . . Nominal Values: f nom: 50.00 Hz Number of phases: 3 V nom (secondary): 110.0 V V primary: 11.00 kV I nom (secondary): 5.000 A I primary: 1.600 kA . . . Residual Voltage/Current Factors: VLN / VN: 1.000 IN / I nom: 1.000 VN (secondary): 63.51 V IN (secondary): 5.000 A Residual Voltage 3 * V0 Residual Current Direction: -3 * I0 Direction: . . . Limits: V max: 150.0 V I max: 35.00 A . . . Debounce/Deglitch Filters: Debounce time: 2.000 ms Deglitch time: 0.00 s . . . Overload Detection: Suppression time: 50.00 ms . . . Other Device Properties: Drop-out time: 20.00 ms
Test Object - Overcurrent Parameters
. General - Values: TimeTolAbs: 0.06 s VT connection: n/a TimeTolRel: 5.00 % CT starpoint connection: n/a CurrentTolAbs: 0.05 Iref CurrentTolRel: 5.00 % Directional: No . Elements - Phase: Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction Yes EF-IDMT IEC Normal Inverse 0.10 Iref 0.10 0.95 Non Directional Yes EF-DMT IEC Definite Time 1.50 Iref 0.02 s 0.95 Non Directional . Test Module Name: OMICRON Overcurrent Version: 4.30 Test Start: 23-Jul-2023 17:19:12 Test End: 23-Jul-2023 17:19:30 User Name: Manager: Company:
Test Settings: . Fault Model: Time reference: Fault inception Load current: 0.00 A Load angle: n/a Prefault time: 100.0 ms Abs. max time: 5.000 s Post fault time: 500.0 ms Rel. max time: 100.0 % Enable voltage output: No Fault voltage LN (for all but two phase faults): n/a Fault voltage LL (for two phase faults): n/a Decaying DC active: No Time constant: n/a CB char min time: 50.00 ms Thermal reset active: No Thermal reset method: n/a Thermal reset message: n/a . Shot Test: Type Relative To Factor Magnitude Angle tnom tmin tmax L1-E EF-IDMT 2.000 1.000 A n/a 1.003 s 702.0 ms 1.805 s L1-E EF-IDMT 7.000 3.500 A n/a 352.8 ms 285.5 ms 422.0 ms L2-E EF-IDMT 2.000 1.000 A n/a 1.003 s 702.0 ms 1.805 s L2-E EF-IDMT 7.000 3.500 A n/a 352.8 ms 285.5 ms 422.0 ms L3-E EF-IDMT 2.000 1.000 A n/a 1.003 s 702.0 ms 1.805 s L3-E EF-IDMT 7.000 3.500 A n/a 352.8 ms 285.5 ms 422.0 ms L1-E EF-DMT 1.067 8.000 A n/a 20.00 ms 0.00 s 75.00 ms L1-E EF-DMT 1.267 9.500 A n/a 20.00 ms 0.00 s 75.00 ms L2-E EF-DMT 1.067 8.000 A n/a 20.00 ms 0.00 s 75.00 ms L2-E EF-DMT 1.267 9.500 A n/a 20.00 ms 0.00 s 75.00 ms L3-E EF-DMT 1.067 8.000 A n/a 20.00 ms 0.00 s 75.00 ms L3-E EF-DMT 1.267 9.500 A n/a 20.00 ms 0.00 s 75.00 ms . Binary Outputs: Name State Bin. out 1 0 Bin. out 2 0 Bin. out 3 0 Bin. out 4 0
Binary Inputs: Trigger Logic: And Name Trigger State Trip 1 Start X . Shot Test Results: Type Relative To Factor Magnitude Angle tnom tact Deviation Overload Result L1-E EF-IDMT 2.000 1.000 A n/a 1.003 s 1.021 s 1.805 % No Passed L1-E EF-IDMT 7.000 3.500 A n/a 352.8 ms 363.0 ms 2.899 % No Passed L2-E EF-IDMT 2.000 1.000 A n/a 1.003 s 1.023 s 2.014 % No Passed L2-E EF-IDMT 7.000 3.500 A n/a 352.8 ms 363.1 ms 2.927 % No Passed L3-E EF-IDMT 2.000 1.000 A n/a 1.003 s 1.017 s 1.446 % No Passed L3-E EF-IDMT 7.000 3.500 A n/a 352.8 ms 365.1 ms 3.494 % No Passed L1-E EF-DMT 1.067 8.000 A n/a 20.00 ms 27.10 ms 35.50 % No Passed L1-E EF-DMT 1.267 9.500 A n/a 20.00 ms 26.30 ms 31.50 % No Passed L2-E EF-DMT 1.067 8.000 A n/a 20.00 ms 28.70 ms 43.50 % No Passed L2-E EF-DMT 1.267 9.500 A n/a 20.00 ms 26.80 ms 34.00 % No Passed L3-E EF-DMT 1.067 8.000 A n/a 20.00 ms 27.70 ms 38.50 % No Passed L3-E EF-DMT 1.267 9.500 A n/a 20.00 ms 26.20 ms 31.00 % No Passed . Charts for Fault Types: Type Angle L1-E n/a t/s
