Device: Name/description: BACK UP IMP RELAY Manufacturer: SIEMENS AG Device type: 7SA522 Device address: 409R Serial/model number: 7SA522 Additional info 1: 25.03.2024 Additional info 2:
Nominal Values: f nom: 50.00 Hz Number of phases: 3 V nom (secondary): 110.0 V V primary: 400.0 kV I nom (secondary): 1.000 A I primary: 200.0 A
Test Object - Distance Settings
System parameters: Line length: 15.00 Ω Line angle: 89.00 ° PT connection: at line CT starpoint: Dir. line Impedance correction no 1A/I nom: Impedances in primary no values:
Tolerances: Tol. T rel.: 3.000 % Tol. T abs. +: 10.00 ms Tol. T abs. -: 30.00 ms Tol. Z rel.: 3.000 % Tol. Z abs.: 0.00 Ω
Grounding factor: RE/RL: 0.000000 XE/XL: 0.000000 Separate arc no resistance:
Zone Settings: Tol. T Tol. T Label Type Fault loop Trip time Tol. T rel Tol. Z rel. Tol. Z abs abs+ abs- Z Tripping Tripping L-L 1.230 s 3.000 % 10.00 ms 30.00 ms 3.000 % 1.399 Ω 1 LL Quad Z Tripping Tripping L-E 1.230 s 3.000 % 10.00 ms 30.00 ms 3.000 % 1.401 Ω 1 LE Quad X/Ω
45
40
35
30
25
20
15
10
-30 -20 -10 0 10 20
R/Ω
Test Module Name: OMICRON Advanced Distance Version: 4.10 Test Start: 25-Mar-2024 12:51:22 Test End: 25-Mar-2024 12:55:24 User Name: Manager: Company: POWERGRID
Test Settings Test model: Test model: constant test current ITest: 2.000 A Allow reduction of yes kS = kL: no ITest/VTest: ZS mag.: 0.00 Ω ZS angle: 0.00 ° kS mag.: 1.000 kS angle: 0.00 °
Times: Prefault: 1.000 s Max. fault: 6.000 s Postfault: 500.0 ms Time reference: fault inception
Test Results Shot Test: Fault Type L1-E |Z| Phi % % of t nom t act. Dev. ITest: Result 4.000 Ω 80.00 ° n/a 1.230 s 1.213 s -1.407 % 2.000 A Passed 6.141 Ω 30.00 ° n/a no trip no trip n/a 2.000 A Passed 20.82 Ω 84.51 ° n/a 1.230 s 1.219 s -0.9187 % 2.000 A Passed 28.92 Ω 80.00 ° n/a no trip no trip n/a 2.000 A Passed 32.41 Ω 89.00 ° n/a 1.230 s 1.219 s -0.9187 % 2.000 A Passed 38.80 Ω 90.00 ° n/a 1.230 s 1.238 s 0.6667 % 1.964 A Passed 40.00 Ω 82.05 ° n/a no trip no trip n/a 1.905 A Passed 47.41 Ω 83.65 ° n/a no trip no trip n/a 1.607 A Passed 50.31 Ω 87.61 ° n/a no trip no trip n/a 1.515 A Passed 43.12 Ω 87.08 ° n/a 1.230 s 1.233 s 0.2439 % 1.768 A Passed X/Ω
45
40
35
30
25
20
15
10
-20 -10 0 10 20 R/Ω
Shot Test: Fault Type L2-E
|Z| Phi % % of t nom t act. Dev. ITest: Result 30.99 Ω 88.19 ° n/a 1.230 s 1.219 s -0.935 % 2.000 A Passed 36.49 Ω 80.00 ° n/a no trip no trip n/a 2.000 A Passed 22.32 Ω 74.80 ° n/a no trip no trip n/a 2.000 A Passed 17.28 Ω 83.38 ° n/a 1.230 s 1.233 s 0.2439 % 2.000 A Passed 12.00 Ω 62.75 ° n/a no trip no trip n/a 2.000 A Passed X/Ω
45
40
35
30
25
20
15
10
-20 -10 0 10 20 R/Ω
Shot Test: Fault Type L3-E
|Z| Phi % % of t nom t act. Dev. ITest: Result 8.000 Ω 20.00 ° n/a no trip no trip n/a 2.000 A Passed 21.08 Ω 71.58 ° n/a no trip no trip n/a 2.000 A Passed 31.24 Ω 86.53 ° n/a 1.230 s 1.218 s -0.9593 % 2.000 A Passed 35.49 Ω 80.84 ° n/a no trip no trip n/a 2.000 A Passed 40.83 Ω 90.91 ° n/a 1.230 s 1.233 s 0.2195 % 1.867 A Passed 46.86 Ω 81.20 ° n/a no trip no trip n/a 1.626 A Passed X/Ω
45
40
35
30
25
20
15
10
-20 -10 0 10 20 R/Ω
Shot Test: Fault Type L1-L2
|Z| Phi % % of t nom t act. Dev. ITest: Result 8.464 Ω 85.44 ° n/a 1.230 s 1.213 s -1.35 % 2.000 A Passed 7.390 Ω 40.00 ° n/a no trip no trip n/a 2.000 A Passed 21.24 Ω 89.00 ° n/a 1.230 s 1.233 s 0.2683 % 2.000 A Passed 27.39 Ω 80.00 ° n/a no trip no trip n/a 2.000 A Passed 43.60 Ω 87.92 ° n/a 1.230 s 1.243 s 1.065 % 1.514 A Passed X/Ω
45
40
35
30
25
20
15
10
-20 -10 0 10 20 R/Ω
Shot Test: Fault Type L2-L3
|Z| Phi % % of t nom t act. Dev. ITest: Result 4.640 Ω 100.00 ° n/a 1.230 s 1.243 s 1.041 % 2.000 A Passed 18.29 Ω 90.00 ° n/a 1.230 s 1.234 s 0.2927 % 2.000 A Passed 22.58 Ω 73.38 ° n/a no trip no trip n/a 2.000 A Passed 36.98 Ω 89.00 ° n/a 1.230 s 1.239 s 0.6992 % 1.785 A Passed 43.58 Ω 83.09 ° n/a no trip no trip n/a 1.515 A Passed X/Ω
45
40
35
30
25
20
15
10
-20 -10 0 10 20 R/Ω
Shot Test: Fault Type L3-L1
|Z| Phi % % of t nom t act. Dev. ITest: Result 2.315 Ω 80.00 ° n/a 1.230 s 1.233 s 0.2439 % 2.000 A Passed 26.15 Ω 86.75 ° n/a 1.230 s 1.213 s -1.376 % 2.000 A Passed 18.29 Ω 67.26 ° n/a no trip no trip n/a 2.000 A Passed 17.07 Ω 89.00 ° n/a 1.230 s 1.213 s -1.374 % 2.000 A Passed 34.09 Ω 81.50 ° n/a no trip no trip n/a 1.936 A Passed 40.54 Ω 88.33 ° n/a 1.230 s 1.238 s 0.6585 % 1.628 A Passed X/Ω
45
40
35
30
25
20
15
10
-20 -10 0 10 20 R/Ω
Shot Test: Fault Type L1-L2-L3
|Z| Phi % % of t nom t act. Dev. ITest: Result 3.057 Ω 89.00 ° n/a 1.230 s 1.233 s 0.2764 % 2.000 A Passed 6.701 Ω 20.00 ° n/a no trip no trip n/a 2.000 A Passed 17.30 Ω 86.76 ° n/a 1.230 s 1.214 s -1.333 % 2.000 A Passed 24.60 Ω 73.30 ° n/a no trip no trip n/a 2.000 A Passed 43.18 Ω 88.43 ° n/a 1.230 s 1.244 s 1.098 % 1.765 A Passed 34.33 Ω 89.00 ° n/a 1.230 s 1.238 s 0.6341 % 2.000 A Passed 49.40 Ω 87.45 ° n/a no trip no trip n/a 1.543 A Passed X/Ω
Results: t act.: no trip Assessment: Passed t nom: no trip Dev.: n/a t min: no trip t max: no trip Fault Quantities (natural): Fault Quantities (symmetrical): VL1: 76.21 V 0.00 ° V0: 0.00 V n/a VL2: 76.21 V -120.00 ° V1: 76.21 V 0.00 ° VL3: 76.21 V 120.00 ° V2: 0.00 V n/a IL1: 1.543 A -87.45 ° I0: 0.00 A n/a IL2: 1.543 A -207.45 ° I1: 1.543 A -87.45 ° IL3: 1.543 A 32.55 ° I2: 0.00 A n/a VFault: 76.21 V 0.00 ° IFault: 1.543 A -87.45 °
