Scribd
Upload
91 views11 pages

EHT - DST:: Test Object - Device Settings

Uploaded by

dilipeline

The document contains settings and test results for a distance protection relay. It provides details of the device, substation, and line parameters. Fault tests were conducted for various fault types on the three phases. The tests included measurements of fault location impedance, angle, nominal and actual trip times for each zone, and whether the test passed tolerance limits. Graphs of voltage, current, and circuit breaker signals over time are also shown for one of the fault tests.

Copyright:

Attribution Non-Commercial (BY-NC)
Download as RTF, PDF, TXT or read online from Scribd
Download as rtf, pdf, or txt

EHT - DST:: Test Object - Device Settings

Uploaded by

dilipeline
91 views11 pages
The document contains settings and test results for a distance protection relay. It provides details of the device, substation, and line parameters. Fault tests were conducted for various fault types on the three phases. The tests included measurements of fault location impedance, angle, nominal and actual trip times for each zone, and whether the test passed tolerance limits. Graphs of voltage, current, and circuit breaker signals over time are also shown for one of the fault tests.

Original Title

Eht

Copyright

© Attribution Non-Commercial (BY-NC)

Available Formats

RTF, PDF, TXT or read online from Scribd

Did you find this document useful?

Is this content inappropriate?

The document contains settings and test results for a distance protection relay. It provides details of the device, substation, and line parameters. Fault tests were conducted for various fault types on the three phases. The tests included measurements of fault location impedance, angle, nominal and actual trip times for each zone, and whether the test passed tolerance limits. Graphs of voltage, current, and circuit breaker signals over time are also shown for one of the fault tests.

Copyright:

Attribution Non-Commercial (BY-NC)
Download as RTF, PDF, TXT or read online from Scribd
Download as rtf, pdf, or txt
91 views11 pages

EHT - DST:: Test Object - Device Settings

Uploaded by

dilipeline
The document contains settings and test results for a distance protection relay. It provides details of the device, substation, and line parameters. Fault tests were conducted for various fault types on the three phases. The tests included measurements of fault location impedance, angle, nominal and actual trip times for each zone, and whether the test passed tolerance limits. Graphs of voltage, current, and circuit breaker signals over time are also shown for one of the fault tests.

Copyright:

Attribution Non-Commercial (BY-NC)
Download as RTF, PDF, TXT or read online from Scribd
Download as rtf, pdf, or txt
You are on page 1/ 11

EHT.

dst:
.

Test Object - Device Settings


.

Substation/Bay:
Substation:
Bay:

220KV HAL
ISRO 66kv LINE

Substation address:
Bay address:

Manufacturer:
Device address:

SIEMENS
DISTANCE

Number of phases:
V primary:
I primary:

3
110.00 V
1.00 A

IN / I nom:

1.000

I max:

10.00 A

Deglitch time:

0.000 s

Line angle:
CT starpoint:

75.00
dir. line

Tol T abs. -:
Tol Z abs.:

100.0 ms

5.000 %

0.930000
no

XE/XL:

0.180000

100.0 ms

CB close time:
52b%:

100.0 ms

Device:
Name/description:
Device type:
Serial/model number:
Additional info 1:
Additional info 2:

HAL-EHT 66kv LINE


7SA522
BF-0603049753

.
Nominal Values:
f nom:
V nom (secondary):
I nom (secondary):

50.000 Hz
110.00 V
1.000 A

.
Residual Voltage/Current Factors:
VLN / VN:

1.732

.
Limits:
V max:

120.00 V

.
Debounce/Deglitch Filters:
Debounce time:

0.005 s

Test Object - Distance Settings


.
.
System
Parameters:
Line length:
PT connection:
Impedance
correction 1A/I nom:
Impedances in
primary values:

9.530 m
at line
no
no

Tolerances:
Tol. T rel.:
Tol. T abs. +:
Tol. Z rel.:

1.000 %
100.0 ms

100.0 m

Grounding Factor:
RE/RL:
Separate arc
resistance:

.
CB Simulation:
CB trip time:
52a%:

0.000 %

100.0 %

Zone Settings:
Label

Type

Trip time

Tol.T rel

tripping

Fault
loop
L-L

Tol.T
abs100.0 ms

Tol.Z rel

Tol.Z abs

1.000 %

Tol.T
abs+
100.0 ms

Z1

0.000 s

5.000 %

0.000 s

1.000 %

100.0 ms

100.0 ms

5.000 %

L-L

440.0 ms

1.000 %

100.0 ms

100.0 ms

5.000 %

tripping

L-E

350.0 ms

1.000 %

100.0 ms

100.0 ms

5.000 %

Z3

tripping

L-L

840.0 ms

1.000 %

100.0 ms

100.0 ms

5.000 %

Z3

tripping

L-E

840.0 ms

1.000 %

100.0 ms

100.0 ms

5.000 %

Z4

tripping

L-L

1.040 s

1.000 %

100.0 ms

100.0 ms

5.000 %

Z4

tripping

L-E

1.040 s

10.00 %

100.0 ms

100.0 ms

5.000 %

100.0
m
100.0
m
100.0
m
100.0
m
100.0
m
100.0
m
100.0
m
100.0
m

Z1

tripping

L-E

Z2

tripping

Z2

X/m
2000

1500

1000

500

-0

-500

-1000

-1500

-2000

-1.5

-1.0

-0.5

-0.0

0.5

1.0

1.5

2.0

2.5

3.0

R/

Allow reduction of
ITest/VTest:
VTest:
ZS angle:
kS angle:

no

Fault inc. angle:

0.00

Max-fault time:
Time reference:

6.000 s
fault inception

Default Test Settings:


Test model:

constant test current

ITest:
ZS mag.:
kS mag.:
kS = kL:
Fault inc. mode:
DC-offset:
Pre-fault time:
Post-fault time:

2.000 A
1.000
1.000
no
random
no
1.000 s
500.0 ms

10.00 V
74.99
0.00

Test Settings
.
Test Model:
Test model:
Allow reduction of
ITest/VTest:

constant test current


no

ITest

2.000 A

.
Fault Inception:
Mode:
DC-offset:

random
no

n/a

.
Times:
Pre-fault:
Post-fault:

1.000 s
500.0 ms

Max-fault:
Time reference:

6.000 s
fault inception

off
yes

Extended zones:

not active

.
Other:
CB simulation:
Switch off at zero
crossing:

Test Results
Shot Test: Fault Type L1-E
|Z|
14.80
m
43.61
m
69.22
m
100.0
m
321.3
m

Phi
75.00

t nom
0.000 s

t act
14.40 ms

Dev.
14.40 ms

ITest
2.000 A

Result
passed

75.00

0.000 s

33.60 ms

33.60 ms

2.000 A

passed

75.00

350.0 ms

433.8 ms

23.94 %

2.000 A

passed

75.00

840.0 ms

833.1 ms

-0.8214 %

2.000 A

passed

-176.93

1.040 s

1.034 s

-0.5865 %

2.000 A

passed

X/m
2000
1500
1000
500
-0
-500
-1000
-1500
-2000
-2500
-1.5

-1.0

-0.5

-0.0

0.5

1.0

1.5

2.0

2.5

3.0

R/

Shot Test: Fault Type L2-E


|Z|
14.80
m
43.61
m
69.22
m
100.0
m
321.3
m

Phi
75.00

t nom
0.000 s

t act
17.00 ms

Dev.
17.00 ms

ITest
2.000 A

Result
passed

75.00

0.000 s

16.80 ms

16.80 ms

2.000 A

passed

75.00

350.0 ms

433.8 ms

23.94 %

2.000 A

passed

75.00

840.0 ms

843.5 ms

0.4167 %

2.000 A

passed

-176.93

1.040 s

1.033 s

-0.6442 %

2.000 A

passed

X/m
2000
1500
1000
500
-0
-500
-1000
-1500
-2000
-2500
-1.5

-1.0

-0.5

-0.0

0.5

1.0

1.5

2.0

2.5

3.0

R/

Shot Test: Fault Type L3-E


|Z|
14.80
m
43.61
m
69.22
m
100.0
m
321.3
m

Phi
75.00

t nom
0.000 s

t act
14.80 ms

Dev.
14.80 ms

ITest
2.000 A

Result
passed

75.00

0.000 s

17.20 ms

17.20 ms

2.000 A

passed

75.00

350.0 ms

443.1 ms

26.60 %

2.000 A

passed

75.00

840.0 ms

843.9 ms

0.4643 %

2.000 A

passed

-176.93

1.040 s

1.044 s

0.3750 %

2.000 A

passed

X/m
2000
1500
1000
500
-0
-500
-1000
-1500
-2000
-2500
-1.5

-1.0

-0.5

-0.0

0.5

1.0

1.5

2.0

2.5

3.0

R/

Shot Test: Fault Type L1-L2


|Z|
42.29
m
69.74
m
100.0
m
124.5
m

Phi
75.00

t nom
0.000 s

t act
16.70 ms

Dev.
16.70 ms

ITest
2.000 A

Result
passed

75.00

440.0 ms

439.1 ms

-0.2045 %

2.000 A

passed

75.00

840.0 ms

833.8 ms

-0.7381 %

2.000 A

passed

-170.00

1.040 s

1.044 s

0.3558 %

2.000 A

passed

X/m
2000
1500
1000
500
-0
-500
-1000
-1500
-2000
-2500
-1.5

-1.0

-0.5

-0.0

0.5

1.0

1.5

2.0

2.5

3.0

R/

Shot Test: Fault Type L2-L3


|Z|
42.29
m
69.74
m
100.0
m
124.5
m

Phi
75.00

t nom
0.000 s

t act
39.00 ms

Dev.
39.00 ms

ITest
2.000 A

Result
passed

75.00

440.0 ms

443.3 ms

0.7500 %

2.000 A

passed

75.00

840.0 ms

833.6 ms

-0.7619 %

2.000 A

passed

-170.00

1.040 s

1.043 s

0.3365 %

2.000 A

passed

X/m
2000
1500
1000
500
-0
-500
-1000
-1500
-2000
-2500
-1.5

-1.0

-0.5

-0.0

0.5

1.0

1.5

2.0

2.5

3.0

R/

Shot Test: Fault Type L3-L1


|Z|
42.29
m
69.74
m
100.0
m
124.5
m

Phi
75.00

t nom
0.000 s

t act
23.90 ms

Dev.
23.90 ms

ITest
2.000 A

Result
passed

75.00

440.0 ms

433.0 ms

-1.591 %

2.000 A

passed

75.00

840.0 ms

1.484 s

76.63 %

2.000 A

passed

-170.00

1.040 s

1.044 s

0.3558 %

2.000 A

passed

X/m
2000
1500
1000
500
-0
-500
-1000
-1500
-2000
-2500
-1.5

-1.0

-0.5

-0.0

0.5

1.0

1.5

2.0

2.5

3.0

R/

Shot Test: Fault Type L1-L2-L3


|Z|
42.29
m
69.74
m
100.0
m
124.5
m

Phi
75.00

t nom
0.000 s

t act
no trip

Dev.
n/a

ITest
2.000 A

Result
passed

75.00

440.0 ms

no trip

n/a

2.000 A

passed

75.00

840.0 ms

no trip

n/a

2.000 A

passed

-170.00

1.040 s

no trip

n/a

2.000 A

passed

X/m
2000
1500
1000
500
-0
-500
-1000
-1500
-2000
-2500
-1.5

-1.0

-0.5

-0.0

0.5

1.0

1.5

2.0

2.5

3.0

R/

Shot Details:

.
Parameters:
Fault Type:
|Z|:
R:
ITest

L1-L2-L3
124.5 m
-122.6 m
2.000 A

Phi:
X:

-170.00

no trip
1.040 s
940.0 ms

Assessment:
Dev.:
t max:

passed
n/a
no trip

-21.62 m

.
Results:
t act:
t nom:
t min:

.
Fault Quantities (natural):
VL1:
VL2:
VL3:
IL1:
IL2:
IL3:
VFault:
IFault:

249.0 mV
249.0 mV
249.0 mV
2.000 A
2.000 A
2.000 A
249.0 mV
2.000 A

Fault

0.00
-120.00
120.00
170.00
50.00
290.00
0.00
170.00

V/V
75
50
25
0
0.001

-25

0.002

0.003

0.004

0.005

0.006

0.007

0.008

0.009

0.006

0.007

0.008

0.009

t/s

-50
-75
-100

VL1

VL2

VL3

I/A
75
50
25
0
0.001

-25

0.002

0.003

0.004

0.005

t/s

-50
-75
-100

IL1

IL2

IL3

Trip
Start
0.001

0.002

0.003

0.004

0.005

0.006

0.007

0.008

0.009

0.001

0.002

0.003

0.004

0.005

0.006

0.007

0.008

0.009

t/s

CB 52a
CB 52b
Ext. zones active

.
.
Test State:
Test
passed

t/s

You might also like