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IS 15435 (2003): Recommended Practice for Measuring

Thickness Using Ultrasonic Method [MTD 21: Non-Destructive
Testing]

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 IS 15435:2003

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Indian Standard
RECOMMENDED PRACTICE FOR MEASURING
THICKNESS USING ULTRASONIC METHOD

ICS 77.040.20

0 BIS 2003

BURE A-U OF INDIAN STANDARDS

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Non-destructive Testing Sectional Committee, MTD21

FOREWORD

This Indian Standard was adopted by the Bureau of Indian Standards, after the draft finalized by the Non-destructive
Testing Sectional Committee had been approved by the Metallurgical Engineering Division Council.

This method is applicable to any material in which ultrasonic waves will propagate at a constant velocity throughout
the part and from which back reflection can be obtained and resolved.

There are two different situations in which thickness measurement is done:

a) Where the requirement is to determine the exact thickness, and
b) Where the requirement is to determine only the variations in thickness from point to point.

For the purpose of deciding whether a particular requirement of this standard is compIied with the final value
observed or calculated, expressing the result of a test or analysis, shall be rounded off in accordance with
IS 2: 1960 Rules for rounding off numerical values (revised. The number of significant places retained in the
rounded off value should be the same as that of the specified value in this standard.
 IS 15435:2003

Indian Standard
RECOMMENDED PRACTICE FOR MEASURING
THICKNESS USING ULTRASONIC METHOD
1 SCOPE The time interval between the pulse that triggers the
circuit on and the pulse that puts the circuit off is
1.1 This standard deals in with the procedures of measured by a timer or flip-flop circuit. The start of
measurement of thickness using ultrasonic pulse echo time interval can be done by initial pulse, interface echo
method. or the back wall echo. The initial pulse, with electronic
1.2 This standard is applicable to all such materials delay to compensate for travel.time in delay block, etc,
which will give a clear resolvable back wall echo and gives good near surface resolution. Interface echo, via
which do not have variation in the ultrasonic velocity receiver channel, suffers from poor resolution which
in any direction. improves, if echo is received via transmitter channel.
The back wall echo suffers from amplitude variation.
2 REFERENCES
The end of time interval is done by the first back wall
2. I The standards listed below contain provisions which echo. It depends upomthe threshold level and the echo
through reference in this text, constitute provisions of amplnuae or the successwe back wall echo as the case
this standard. At the time of publication, the editions may be which in turn depends upon the transmitted
indicated were valid. All standards are subject to pulse amplitude, receiver gain, beam characteristics,
revision and parties to agreement based on this standard surface conditions, attenuation, etc. Setting up of
are encouraged to investigate the possibility of applying threshold level is important as it may lead to an error
the most recent editions of the standards indicated that occurs when the measurements are made at thicker
below: section and the first half cycle used for calibration at
thin section may get attenuated wel[below the threshold
IS No. Title
level. This inherent error of ultrasonic gauges can be
2417:2003 Glossary of terms relating to reduced appreciably by integrating the full wave
ultrasonic testing (second revision) rectified echo.
12666:1988 Method for performance assessment
The ultrasonic wave depends upon the frequency, probe
of ultrasonic flaw detection
characteristics and the acoustic properties and thickness
equipment
of the material of the sample. Since the exact beam
13805:1993 Guidelines for certification for characteristic in the sample is not known, it forces some
personnel for non-destructive testing errors to enter in. The inherent errors of ultrasonic
3 GLOSSARY gauges can be appreciably reduced by some adjustments
both in the instrument as well as during calibration.
For the purpose of this standard, the definitions given The instrument can be provided with automatic
in 1S 2417 shall apply. amplitude control that makes the heights of echoes equal
even if these are coming from different thicknesses,
4 PRINCIPLE OF MEASUREMENT
This electronic correction is specially necessary in thick
There are two different situations in which thickness samples. It may not be necessary in case (b) above if
lmeasurement is done: the expected variation in thickness is not much. The
thin samples do not require this correction but pose the
a) Where the requirement is to determine the exact
problem of non-linearity in the Vee path, if twin probe
thickness.
is being used.
b) Where the requirement is to determine only the
variation in thickness from point to point. 5 EQUIPMENT FOR MEASUREMENT

In all these situations, the thickness is evaluated as a 5.1 Instrument

product of ultrasonic velocity in the sample and the
time of travel of the ultrasonic waves. The instrument Three different types of instruments can be used. One
(thickness gauge) evaluates the time of flight basically fitted only with a cathode ray tube (CRT), second with
and then multiplies it with a preset value of velocity. In an additional attachment for digital display and the third
situation (a), this preset velocity is the velocity in the with only digitai display. The CRT displays A-scan
test material, and in (b) it is the approximate velocity. presentation. Some of the instruments are additionally
[n place of feeding in the velocity data, the instrument equipped with B-scan presentation for display of
can be calibrated using parallel plate in both the cases. variation of thickness at different points, This is done
IS 15435:2003

by displaying A-scan presentations of various positions material as that of the sample in the form of a parallel
in straight parallel lines. The display is used to measure plate. Its thickness will be exactly measured.
the separation between initial pulse and any of the back Alternately, a site will be selected on the sample where
wall echoes or between any two echoes. The digital parallel faces are available and where probe can be
display simplifies the task of measurement. The placed and the gap (thickness) can be measured.
instrument must be calibrated as per IS 12666 for
linearity and repeatability. The instrument having A-scan display facility will be
calibrated on this reference block or at this selected
5.2 Probes site. The difference between x-axis positions of leading
edges of first and njh back wall echoes from the
A twin p~obe shall be used for thickness measurement
reference block or selected site and that from the test
between 1.5 mm and 20 mm. These probes pose a
location is recorded. The thickness at the test location
problem due to their different Vee path in thinner
is then calculated using the following expression:
samples resulting into large non-linearity below 3 mm
of steel. This requires the linearity correction if twin Sample thickness =
probes are used for thin sections.
Block thickness x Difference for sample
Single probes have large dead zone or poor near surface Difference for block
resolution due to the continuous ringing of crystal and
the finite saturation time of receiver. Such probes shall Use of twin probes is not recommended. High frequency
be used for measurement of samples with thickness will give better accuracy. The frequency of probe shall
above 20 mm. For samples with thickness below be so chosen that at least two echoes from back wall
1.5 mm, single probe with delay lines shall be used. are clearly visible.
These probes shall be highly damped and will have
nominal frequency of 10 MHz or more. 6.1.2 Using Thickness Gauges

The diameter of the probe chosen depends upon several Two reference blocks shall be made out of the material
factors. It would be better to have as small diameter as under test in the form of parallel plates. One will have
possible, say 10 mm, to allow proper contact on curved the thickness near the maximum range of interest and
surface. This will also result in smaller beam diameter the other near the minimum of this range. Their
which gives finer resolution in the measurement of thickness will preferably be measured within the
variation in thickness. However, small diameter probes accuracy better than the display resolution of the gauge.
suffer from larger beam diffraction giving some times
spurious echoes from lateral wall after the first back For the adjustment of delay and range controls, the
wall echo. If the lateral dimensions are not large enough, probe is first placed on the thicker of the two reference
either high frequency has to be used or higher diameter blocks. Any deviation in the thickness reading from
has to be used. the true value is offset by the adjustment of range
(material calibration) control. The probe is then placed
5.3 .Couplant on the thinner block and delay control is adjusted to
get true thickness value. The steps are repeated several
The couplant that allows the transfer of energy from
times till the instrument reads the correct thickness of
transducer to sample and back can affect the
the two blocks. The thickness of the test sample is then
measurement of tkickness. The variation in thickness
measured directly from the gauge.
of couplant while scanning the sample and also the
difference between couplant thickness on reference 6.2 Evaluation of Variation in Thickness
block and test sample shall be kept minimum. The use
of delay line made of a material having small acoustic 6.2.1 Using Instrument with A-scan Displqv
impedance, such as perspex, is recommended for thin
sections. The procedure used to measure the exact thickness
(see 6.1.1) is used for the evaluation of variation in
6 PROCEDURE-OF MEASUREMENT thickness. However, the reference block need not be
m-ade of the same material as that of test sample. It can
The procedure of measurement depends upon the two
be of a material acoustically similar to the sample
situations described in 4 and is given in the following
material. For fast calculations, the ratio of block
clauses.
thickness to difference in positions of echoes can be
6.1 Determination of Exact Thickness rounded offto a single place of decimal. Also, the first
back wall echo may be brought -to zero position by
Either of the following two methods can be used for
introducing the suitable delay.
determination of exact thickness.
6.1.1 Using Instrument with A-scan Display 6.2.2 Using Thickness Gauges

A reference block shall be prepared from the same The procedure is similar to that given in 6.1.2 except

.
L
 IS 15435:2003

that the two blocks need not be made of the same 7 TEMPERATURE EFFECT
material as the test sample. These blocks maybe made
of hard, non-corrosive material if thickness to be The calibration of equipment and reference block must
measured is between 3 mm and 20 mm. Below 3 mm, be done with the same couplant and at the same
blocks made of material acoustically identical to test temperature at which the thickness of the test material
sample have to be taken, if twin probe is used. Above is to be measured. If however, the temperatures of
20 mm, blocks made of material with nearly same calibration block and that of test material are different,
attenuation as test sample are to be used. The variation the correction factor must be applied. The correction
in thickness of the test sample is measured directly from factor shall be different for different materials and must
the gauge. be known experimentally.
Bureau of Indian Standards

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Review of In&lan Standards

Amendments are issued to standards as the need arises on the basis of comments. Standards are also reviewed
period ically; a standard along with amendments is reaffirmed when such review indicates that no changes are
needed; if the review indicates that changes are needed, it is taken up for revision. Users of Indian Standards
shou Id ascertain that they are in possession of the latest amendments or edition by referring to the latest issue of
BIS Catalogue and Standards: Monthly Additions.

This Indian Standard has been developed from Dot: No. MTD 21 (4207).

Amendments Issued Since Publication

Amend No. Date of Issue Text Affected

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