Sllimm - 2 Series IPM, 3-Phase Inverter, 25 A, 600 V Short-Circuit Rugged IGBT
Sllimm - 2 Series IPM, 3-Phase Inverter, 25 A, 600 V Short-Circuit Rugged IGBT
Sllimm - 2 Series IPM, 3-Phase Inverter, 25 A, 600 V Short-Circuit Rugged IGBT
Datasheet
SLLIMM - 2nd series IPM, 3-phase inverter, 25 A, 600 V short-circuit rugged IGBT
Features
• IPM 25 A, 600 V, 3-phase IGBT inverter bridge including 2 control ICs for gate
driving and freewheeling diodes
• 3.3 V, 5 V TTL/CMOS inputs with hysteresis
• Internal bootstrap diode
• Under-voltage lockout of gate drivers
• Smart shutdown function
• Short-circuit protection
Marking area • Shutdown input/fault output
• Separate open emitter outputs
• Built-in temperature sensor
• Comparator for fault protection
• Short-circuit rugged TFS IGBTs
• Very fast, soft recovery diodes
• 85 kΩ NTC, UL 1434, CA 4 recognized
• Fully isolated package
• Isolation rating of 1600 Vrms/min
• UL recognition: UL 1557, file E81734
SDIP2B-26L type L1
Applications
• 3-phase inverters for motor drives
• Washing machines
• Dryer
• Industrial fans
• Pumps
NC(1 ) (26)T1
VbootU(2) (25)T2
VbootV(3)
VbootW(4)
(24)P
HinU(5) (23)U
HinV(6)
HinW(7) (22)V
VccH(8)
(21)W
GND(9)
H-side
LinU(10)
LinV(11)
LinW(12)
(20)NU
VccL(13)
SD/OD(14) (19)NV
Cin(15)
GND(16) (18)NW
TSO(17)
L-side
GIPG120520140842FSR
1 NC -
2 VBOOTu Bootstrap voltage for U phase
3 VBOOTv Bootstrap voltage for V phase
4 VBOOTw Bootstrap voltage for W phase
5 HINu High-side logic input for U phase
6 HINv High-side logic input for V phase
7 HINw High-side logic input for W phase
8 VCCH High-side low voltage power supply
9 GND Ground
10 LINu Low-side logic input for U phase
11 LINv Low-side logic input for V phase
12 LINw Low-side logic input for W phase
13 VCCL Low-side low voltage power supply
14 SD /OD Shutdown logic input (active low) / open-drain (comparator output)
15 CIN Comparator input
16 GND Ground
17 TSO Temperature sensor output
18 NW Negative DC input for W phase
19 NV Negative DC input for V phase
20 NU Negative DC input for U phase
21 W W phase output
22 V V phase output
23 U U phase output
24 P Positive DC input
25 T2 NTC thermistor terminal 2
26 T1 NTC thermistor terminal 1
VIN Logic input voltage applied between HINx, LINx and GND -0.3 15 V
Isolation withstand voltage applied between each pin and heat sink plate
VISO 1600 Vrms
(AC voltage, t = 60 s)
TJ Power chips operating junction temperature range -40 to 175 °C
3 Electrical characteristics
Table 6. Static
tc(on) (1)
Cross-over time on - 205 -
tc(off) (1)
Cross-over time off VDD = 300 V, VCC = Vboot = 15 V, - 182 -
VIN (2) = 0 to 5 V, IC = 20 A
trr Reverse recovery time - 310 -
tc(on) (1)
Cross-over time on - 240 -
tc(off) (1)
Cross-over time off VDD = 300 V, VCC = Vboot = 15 V, - 170 -
VIN (2) = 0 to 5 V, IC = 25 A
trr Reverse recovery time - 320 -
1. ton and toff include the propagation delay time of the internal drive. tC(on) and tC(off) are the switching times of the IGBT itself
under the internally given gate driving condition.
2. Applied among HINx, LINx and GND for x = U, V, W
Ic
HIN HVG
L
GND OUT
5V
+
C Vdd
-
0V
Input VCC
LIN +
Rsd
Vce
+5V SD LVG
-
CIN
GND
100% IC 100% IC
t rr
VCE IC IC VCE
VIN VIN
t ON t OFF
t C(ON) t C(OFF)
VIN(ON) 10% IC 90% IC 10% VCE VIN(OFF) 10% VCE 10% IC
High-side
VCC_hys VCC UV hysteresis 1.2 1.4 1.7 V
Low-side
VCC_hys VCC UV hysteresis 1.1 1.4 1.6 V
VCC = 10 V,
Under voltage quiescent supply
Iqccu SD pulled to 5 V through RSD = 10 kΩ, 600 800 µA
current
CIN = LINx(1) = 0 V
VCC = 15 V, SD= 5 V,
Iqcc Quiescent current 700 900 µA
CIN = LINx(1) = 0 V
VSSD Smart SD unlatch threshold 0.5 0.6 0.75 V
The comparator stays enabled even if VCC is in the UVLO condition but higher than 4 V.
4 Fault management
The device integrates an open-drain output connected to the SD pin. As soon as a fault occurs, the open-drain is
activated and the LVGx outputs are forced low. Two types of fault can be identified:
• Overcurrent (OC) sensed by the internal comparator (see more detail in Section 4.1 Smart shutdown
function);
• Undervoltage on supply voltage (VCC)
Each fault enables the SD open drain for a different time, as described in the following table.
Symbol Parameter Event time (1) SD open-drain enable time result (1)(2)
≤ 24 μs 24 μs
OC Over-current event
> 24 µs OC time
≤ 70 μs 70 µs
> 70 µs
UVLO Under-voltage lockout event
until the VCC_LS exceeds the UVLO time
VCC_LS UV turn ON threshold
Actually, the device remains in a fault condition (SD at low logic level and LVGx outputs disabled) for a time also
depending on the RC network connected to the SD pin. The network generates a time contribution that is added
to the internal value.
GIPG120520141638FSR
GIPG120520141644FSR
comp
Vref
PROTECTION
CIN
t CIN_SD
LIN
LVG
SD
open-drain gate
(internal)
t1 t2
t OC
Fast shutdown:
the driver outputs are set in SD state
t1
immediately after comparator triggering
even if the SD signal has not yet reached
the lower input threshold
t2
SHUTDOWN CIRCUIT
where:
VBIAS
RSD
FROM / TO SD
CONTROLLER
SMART
R PD_SD
CSD R ON_OD
SD
LOGIC
RON_OD = VOD/5 mA, see Table 10. Sense comparator (VCC = 15 V, unless otherwise is specified);
RPD_SD (typ.) = 5 V/ISDh
In common overcurrent protection designs, the comparator output is usually connected to the SD input and an RC
network is connected to this SD line in order to provide a mono-stable circuit which implements a protection time
that follows the fault condition.
As opposed to common fault detection systems, the device smart shutdown architecture allows the immediate
turn-off of output gates driver in case of fault, by minimizing the propagation delay between the fault detection
event and the actual switching off of the outputs. In fact, the time delay between the fault and the turning off of the
outputs is no longer dependent on the RC value of the external network connected to the pin.
In the smart shutdown circuitry, the fault signal has a preferential path which directly switches off the outputs after
the comparator triggering.
At the same time, the internal logic turns on the open-drain output and holds it on until the SD voltage goes below
the VSSD threshold and the toc time is elapsed.
The driver outputs restart following the input pins as soon as the voltage at the SD pin reaches the higher
threshold of the SD logic input.
The smart shutdown system provides the possibility to increase the time constant of the external RC network (i.e.,
the disable time after the fault event) up to very high values without increasing the delay time of the protection.
VTSO IGBT110820161234TSO
(V)
2.8
Min
2.2
1.6
Typ
Max
1.0
0.4
0 25 50 75 100 T (°C)
R25 Resistance T = 25 °C 85 kΩ
3000
2500
2000
1500
Typ
1000
500 Max
0 Min
-50 -25 0 25 50 75 100 125 T(°C)
30
25
20
Max
15
Typ
10
Min
0
50 60 70 80 90 100 110 120 T(°C)
DS11295 - Rev 8
3.3V/5 V
(1)NC T1(26)
Dz1 C3 CbootU VTSO/NTC
R1 (5)HinU U(23)
Hin V
C1 (6)HinV
(7)HinW
M
Hin W R1 V(22)
C1
+ (8)VccH
Application circuit example
Vc c
- Cvc c C2 W(21)
Lin U R1 Dz2
(9)GND H-side
C1
Lin V R1 (10)LinU
C1 (11)LinV
Lin W R1 (12)LinW +
C4 Cvdc
-
C1
NU(20)
+ (13)VccL
MICROCONTROLLER
Vcc
- Cvcc C2 Dz2
3.3V/5 V
(14)SD/OD NV(19)
Figure 10. Application circuit example
RSD
Fault
(15)Cin
VTSO/NTC
CSD (16)GND NW(18)
SGN_GND
(17)TSO L-side
VTSO/NTC
Rshunt
CSF
PWR_GND
Application designers are free to use a different scheme according to the device specifications.
page 16/24
STGIB20M60TS-L
Application circuit example
STGIB20M60TS-L
Guidelines
6.1 Guidelines
1. Input signals HIN, LIN are active-high logic. A 100 kΩ (typ.) pull-down resistor is built-in for each input pin.
To prevent input signal oscillations, the wiring of each input should be as short as possible and the use of
RC filters (R1, C1) on each input signal is suggested. The filters should be with a time constant of about 100
ns and placed as close as possible to the IPM input pins.
2. The use of a bypass capacitor CVCC (aluminum or tantalum) can reduce the transient circuit demand on
the power supply. Besides, to reduce any high-frequency switching noise distributed on the power lines, a
decoupling capacitor C2 (100 to 220 nF, with low ESR and low ESL) should be placed as close as possible
to each Vcc pin and in parallel with the bypass capacitor.
3. The use of an RC filter (RSF, CSF) prevents protection circuit malfunctions. The time constant (RSF x CSF)
should be set to 1 µs and the filter must be placed as close as possible to the CIN pin.
4. The SD is an input/output pin (open-drain type if it is used as output). It should be pulled up to a power
supply (i.e., MCU bias at 3.3/5 V) by a resistor value, which can keep the Iod no higher than 5 mA (VOD ≤
500 mV when open-drain MOSFET is ON). The filter on SD should be sized to get a desired re-starting time
after a fault event and placed as close as possible to the SD pin.
5. A decoupling capacitor CTSO between 1 nF and 10 nF can be used to increase the noise immunity of the
TSO thermal sensor; a similar decoupling capacitor COT (between 10 nF and 100 nF) can be implemented
if the NTC thermistor is available and used. In both cases, their effectiveness is improved if these capacitors
are placed close to the MCU.
6. The decoupling capacitor C3 (100 to 220 nF with low ESR and low ESL) in parallel with each Cboot filters
high-frequency disturbances. Both Cboot and C3 (if present) should be placed as close as possible to the
U,V,W and Vboot pins. Bootstrap negative electrodes should be connected to the U,V,W terminals directly
and separated from the main output wires.
7. To prevent overvoltage on the VCC pin, a Zener diode (Dz1) can be used. Similarly on the Vboot pin, a Zener
diode (Dz2) can be placed in parallel with each Cboot.
8. The use of the decoupling capacitor C4 (100 to 220 nF, with low ESR and low ESL) in parallel with the
electrolytic capacitor CVdc prevents surge destruction. Both capacitors C4 and CVdc should be placed as
close as possible to the IPM (C4 has priority over Cvdc).
9. By integrating an application-specific type HVIC inside the module, direct coupling to the MCU terminals
without an optocoupler is possible.
10. Low inductance shunt resistors should be used for phase leg current sensing.
11. In order to avoid malfunctions, the wiring on N pins, the shunt resistor and PWR_GND should be as short as
possible.
12. The connection of the SGN_GND to the PWR_GND at one point only (close to the shunt resistor terminal)
can reduce the impact of power ground fluctuation.
These guidelines ensure the device specifications for application designs. For further details, please refer to the
relevant application note.
10
1.3
0 0.8
0.0 0.5 1.0 1.5 2.0 2.5 VCE(V) 0 10 20 30 40 IC(A)
IC GADG080520191224CCT VF IGBTKRFEBDVFvsforcurr
(A) VGE ≥ 15 V, TJ ≤ 175 °C (V)
25 2.4
TJ = 25 °C
2.0
20
TJ = 175 °C
1.6
15
1.2
10
0.8
5
0.4
0
0 25 50 75 100 125 150 TC (°C) 0.0
0 10 20 30 40 IF (A)
Figure 15. EON switching energy vs collector current Figure 16. EOFF switching energy vs collector current
EON IGBTKRFEBEONSwenvscollcurr EOFF IGBTKRFEBEOFFSwenvscollcurr
(mJ) VDD = 300 V, VCC = Vboot = 15 V (mJ) VDD = 300 V, VCC = Vboot = 15 V
1.4
6.0
1.2
0.0 0.0
0 10 20 30 40 IC(A) 0 10 20 30 40 IC(A)
K GIPD290720151032FSR
10 -1
10 -2
10 -5 10 -4 10 -3 10 -2 10 -1 10 0 t p (s)
8 Package information
In order to meet environmental requirements, ST offers these devices in different grades of ECOPACK packages,
depending on their level of environmental compliance. ECOPACK specifications, grade definitions and product
status are available at: www.st.com. ECOPACK is an ST trademark.
8450802_7_type_L1_IGBT
Dimensions (mm)
Ref.
Min. Typ. Max.
Revision history
08-Nov-2016 3 Modified Figure 15: "VTSO output characteristics vs. LVIC temperature"
Updated Section 8.1: "SDIP2B-26L type L package information"
Minor text changes
Document status promoted from preliminary data to production data.
06-Oct-2017 4 Updated features in cover page and Table 12: "Fault timing".
Minor text changes
Updated Section 8.1 SDIP2B-26L type L package information.
07-Jun-2018 5
Minor text changes
Added Figure 13. IC vs case temperature.
13-May-2019 6 Updated Section 8.1 SDIP2B-26L type L1 package information.
Minor text changes.
27-May-2019 7 Modified Figure 11. Output characteristics.
Updated the features in cover page and Table 4. Total system.
21-Sep-2021 8
Minor text changes.
Contents
1 Internal schematic and pin description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
2 Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
2.1 Thermal data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
3 Electrical characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
3.1 Inverter part . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
3.2 Control/protection parts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8