Chapter 37
Chapter 37
Chapter 37
Introduction
Interference (giao thoa)
In constructive interference (giao thoa tăng cường) the amplitude of the resultant
wave is greater than that of either individual wave.
In destructive interference (giao thoa triệt tiêu) the amplitude of the resultant
wave is less than that of either individual wave.
All interference associated with light waves arises when the electromagnetic
fields that constitute the individual waves combine.
Section 37.1
Young’s Double-Slit Experiment: Schematic
Section 37.1
Resulting Interference Pattern
The light from the two slits forms a
visible pattern on a screen.
The pattern consists of a series of
bright and dark parallel bands called
fringes (vân).
Constructive interference occurs where
a bright fringe (vân sáng) occurs.
Destructive interference results in a
dark fringe (vân tối).
Section 37.1
Interference Patterns
Section 37.1
Interference Patterns, 2
The lower wave has to travel farther
than the upper wave to reach point P.
The lower wave travels one wavelength
farther.
Therefore, the waves arrive in
phase
A second bright fringe occurs at this
position.
Section 37.1
Interference Patterns, 3
The upper wave travels one-half of a
wavelength farther than the lower wave
to reach point R.
The trough of the upper wave overlaps
the crest of the lower wave.
This is destructive interference.
A dark fringe occurs.
Section 37.1
Conditions for Interference
To observe interference in light waves, the following two conditions must be met:
The sources must be coherent (kết hợp).
They must maintain a constant phase with respect to each other.
The sources should be monochromatic (đơn sắc).
Monochromatic means they have a single wavelength.
Section 37.1
Producing Coherent Sources
Section 37.1
Diffraction (nhiễu xạ)
Section 37.1
Young’s Double-Slit Experiment: Geometry
Section 37.2
Interference Equations
Section 37.2
Interference Equations, cont.
The positions of the fringes can be measured vertically from the zeroth-order
maximum.
Using the large triangle in fig. 37.5,
ybright = L tan qbright
ydark = L tan qdark
Section 37.2
Interference Equations, final
Section 37.2
Uses for Young’s Double-Slit Experiment
Section 37.2
Intensity Distribution: Double-Slit Interference Pattern
The bright fringes in the interference pattern do not have sharp edges.
The equations developed give the location of only the centers of the bright
and dark fringes.
We can calculate the distribution of light intensity associated with the double-slit
interference pattern.
Assumptions:
The two slits represent coherent sources of sinusoidal waves.
The waves from the slits have the same angular frequency, ω.
The waves have a constant phase difference, φ.
The total magnitude of the electric field at any point on the screen is the
superposition of the two waves.
Section 37.3
Intensity Distribution, Electric Fields
The phase difference between the two waves at P depends on their path
difference.
δ = r2 – r1 = d sin θ
A path difference of λ (for constructive interference) corresponds to a phase
difference of 2π rad.
A path difference of δ is the same fraction of λ as the phase difference φ is of 2π.
This gives
2π 2π
φ δ d sin θ
λ λ
Section 37.3
Intensity Distribution, Resultant Field
The magnitude of the resultant electric field comes from the superposition
principle.
EP = E1+ E2 = Eo[sin ωt + sin (ωt + φ)]
This can also be expressed as
φ φ
EP 2Eocos sin ωt
2 2
EP has the same frequency as the light at the slits.
The magnitude of the field is multiplied by the factor 2 cos (φ / 2).
Section 37.3
Intensity Distribution, Equation
The expression for the intensity comes from the fact that the intensity of a wave
is proportional to the square of the resultant electric field magnitude at that point.
The intensity therefore is
πd sin θ 2 πd
I Imax cos2
max
I cos y (small angles )
λ λL
Section 37.3
Light Intensity, Graph
Section 37.3
Multiple Slits, Graph
Section 37.3
Lloyd’s Mirror
Section 37.4
Interference Pattern from a Lloyd’s Mirror
Section 37.4
Phase Changes Due To Reflection
Section 37.4
Phase Changes Due To Reflection, cont.
Section 37.4
Interference in Thin Films
Section 37.5
Interference in Thin Films, 2
Section 37.5
Interference in Thin Films, 3
Section 37.5
Interference in Thin Films, 4
Section 37.5
Interference in Thin Films, 5
If the thin film is between two different media, one of lower index than the film
and one of higher index, the conditions for constructive and destructive
interference are reversed.
With different materials on either side of the film, you may have a situation in
which there is a 180o phase change at both surfaces or at neither surface.
Be sure to check both the path length and the phase change.
Section 37.5
Interference in Thin Film, Soap Bubble Example
Section 37.5
Newton’s Rings
Section 37.5
Newton’s Rings, Set-Up and Pattern
Section 37.5
Problem Solving Strategy with Thin Films, 1
Conceptualize
Identify the light source.
Identify the location of the observer.
Categorize
Be sure the techniques for thin-film interference are appropriate.
Identify the thin film causing the interference.
Section 37.5
Problem Solving with Thin Films, cont.
Analyze
The type of interference – constructive or destructive – that occurs is
determined by the phase relationship between the upper and lower surfaces.
Phase differences have two causes.
differences in the distances traveled
phase changes occurring on reflection
Both causes must be considered when determining constructive or
destructive interference.
Use the indices of refraction of the materials to determine the correct
equations.
Finalize
Be sure your results make sense physically.
Be sure they are of an appropriate size.
Section 37.5
Michelson Interferometer
The interferometer was invented by an American physicist, A. A. Michelson.
The interferometer splits light into two parts and then recombines the parts to
form an interference pattern.
The device can be used to measure wavelengths or other lengths with great
precision.
Section 37.6
Michelson Interferometer, Schematic
The interference condition for the two rays is determined by their path length
difference.
M1 is moveable.
As it moves, the fringe pattern collapses or expands, depending on the direction
M1 is moved.
The fringe pattern shifts by one-half fringe each time M1 is moved a distance λ/4.
The wavelength of the light is then measured by counting the number of fringe
shifts for a given displacement of M1.
Section 37.6
Michelson Interferometer – Applications
The Michelson interferometer was used to disprove the idea that the Earth moves
through an ether.
Modern applications include:
Fourier Transform Infrared Spectroscopy (FTIR)
Laser Interferometer Gravitational-Wave Observatory (LIGO)
Section 37.6
Fourier Transform Infrared Spectroscopy
Section 37.6
Laser Interferometer Gravitational-Wave Observatory
Section 37.6
LIGO in Richland, Washington
Section 37.6