INTERNATIONAL ISO

STANDARD 7637-3

Second edition
2007-07-01

Road vehicles — Electrical disturbances

from conduction and coupling —
Part 3:
Electrical transient transmission by
capacitive and inductive coupling via
lines other than supply lines
Véhicules routiers — Perturbations électriques par conduction et par
couplage —
Partie 3: Transmission des perturbations électriques par couplage
capacitif ou inductif le long des lignes autres que les lignes
d'alimentation

Reference number
ISO 7637-3:2007(E)

© ISO 2007
ISO 7637-3:2007(E)

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ii © ISO 2007 – All rights reserved

 ISO 7637-3:2007(E)

Contents Page

Foreword............................................................................................................................................................ iv
Introduction ........................................................................................................................................................ v
1 Scope ..................................................................................................................................................... 1
2 Normative references ........................................................................................................................... 1
3 Test methods......................................................................................................................................... 2
3.1 General................................................................................................................................................... 2
3.2 Standard test conditions...................................................................................................................... 3
3.3 Ground plane......................................................................................................................................... 3
3.4 Test set-up............................................................................................................................................. 3
3.5 Application of transient test pulses.................................................................................................... 8
4 Test instrument description and specification ................................................................................ 10
4.1 Power supply....................................................................................................................................... 10
4.2 Oscilloscope........................................................................................................................................ 10
4.3 Test pulse generator........................................................................................................................... 10
4.4 Capacitive coupling clamp ................................................................................................................ 14
4.5 Direct coupling capacitor................................................................................................................... 17
4.6 Inductive coupling clamp................................................................................................................... 17
Annex A (normative) Calibration fixture used for the ICC test method...................................................... 18
Annex B (informative) Example of test severity levels associated with functional performance
status classification............................................................................................................................ 19
Annex C (informative) Estimation of the inductive coupling factor ............................................................ 22
Bibliography ..................................................................................................................................................... 24

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ISO 7637-3:2007(E)

Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies
(ISO member bodies). The work of preparing International Standards is normally carried out through ISO
technical committees. Each member body interested in a subject for which a technical committee has been
established has the right to be represented on that committee. International organizations, governmental and
non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the
International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.

International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.

The main task of technical committees is to prepare International Standards. Draft International Standards
adopted by the technical committees are circulated to the member bodies for voting. Publication as an
International Standard requires approval by at least 75 % of the member bodies casting a vote.

Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO shall not be held responsible for identifying any or all such patent rights.

ISO 7637-3 was prepared by Technical Committee ISO/TC 22, Road vehicles, Subcommittee SC 3, Electrical
and electronic equipment.

This second edition cancels and replaces the first edition (ISO 7637-3:1995), which has been technically
revised. It also incorporates the Technical Corrigendum ISO 7637-3:1995/Cor.1:1995.

ISO 7637 consists of the following parts, under the general title Road vehicles — Electrical disturbances from
conduction and coupling:

⎯ Part 1: Definitions and general considerations

⎯ Part 2: Electrical transient conduction along supply lines only

⎯ Part 3: Electrical transient transmission by capacitive and inductive coupling via lines other than supply
lines

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 ISO 7637-3:2007(E)

Introduction
Experience collected over a long period of immunity testing of instruments, equipment and devices under test
(DUTs) shows that a test simulating transient coupling phenomena is needed for a sufficient coverage of the
wide range of electric and electromagnetic interferences. The knowledge of these facts is common among
electomagnetic conductivity (EMC) experts, and many companies have developed such coupling tests.

The fast transient test uses bursts composed of a number of fast transients, which are coupled into lines of
electronic equipment, in particular input/output (I/O) lines. The fast rise time, the repetition rate and the low
energy of the fast transient bursts are significant to the test.

The slow transient test uses a single pulse similar to that used for conducted transient, applied a number of
times to the DUT.

During system development, the production wiring harness is not available and the vehicle's electrical noises
are not known. The test shall therefore be performed with the worst case situation, which is represented by
the capacitive and inductive coupling described in this part of ISO 7637.

© ISO 2007 – All rights reserved v

INTERNATIONAL STANDARD ISO 7637-3:2007(E)

Road vehicles — Electrical disturbances from conduction and

coupling —
Part 3:
Electrical transient transmission by capacitive and inductive
coupling via lines other than supply lines

1 Scope
This part of ISO 7637 establishes a bench top test for the evaluation of the immunity of devices under test
(DUTs) to transient transmission by coupling via lines other than supply lines. The test transient pulses
simulate both fast and slow transient disturbances, such as those caused by the switching of inductive loads
and relay contact bounce.

Three test methods are described in this part of ISO 7637:

⎯ the capacitive coupling clamp (CCC) method;

⎯ the direct capacitive coupling (DCC) method; and

⎯ the inductive coupling clamp (ICC) method.

NOTE The applicability of the three test methods is shown in Table 1.

Only one test method need be selected for slow transients and only one method need be selected for fast
transients.

This part of ISO 7637 applies to road vehicles fitted with nominal 12 V, 24 V or 42 V electrical systems.

For transient immunity, Annex B provides recommended test severity levels in line with the functional
performance status classification (FPSC) principle described in ISO 7637-1.

2 Normative references
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

ISO 7637-2, Road vehicles — Electrical disturbances from conduction and coupling — Part 2: Electrical
transient conduction along supply lines only

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3 Test methods

3.1 General

This clause describes methods for testing the immunity of electrical system components or devices under test
(DUTs) against coupled transients. These tests shall be performed in the laboratory.

The test pulse severity levels should be mutually agreed upon between the vehicle manufacturer and the
supplier prior to the test.

The test pulses defined are typical pulses which represent the characteristics of most of the actual transients
which may occur in the vehicle.

In special cases, it may be necessary to apply additional test pulses. Some test pulses may be omitted if a
device, depending on its function or its configuration, is not influenced by comparable transients in the vehicle.
It is part of the vehicle manufacturer's responsibility to define the test pulses needed for specific components.

A test plan shall be written to define

⎯ the test methods to be used,

⎯ the test pulses to be applied,

⎯ the test pulse amplitudes,

⎯ the number of pulses to be applied,

⎯ the DUT operating modes,

⎯ the wiring harness (test versus production),

⎯ the leads to be included in the capacitive coupling clamp, if used,

⎯ the leads to be tested using the direct coupling capacitor method, if used,

⎯ the capacitance values to be used, if the direct coupling capacitor method is used,

⎯ the leads to be included in the inductive coupling clamp, if used,

⎯ the type of inductive coupling clamp, if the inductive coupling method is used.

Suggested values for the evaluation of immunity of DUTs can be chosen from Tables B.1, B.2, B.3 and B.4.

The applicability of the three different test methods is indicated in Table 1. Only one test method need be
selected for slow transients and only one method need be selected for fast transients.

Table 1 — Test method applicability

Transient type CCC method DCC method ICC method

Slow pulses of 4.3.3 Not applicable Applicable Applicable

Fast pulses a and b of 4.3.2 Applicable Applicable Not applicable

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3.2 Standard test conditions

The ambient temperature during the test shall be (23 ± 5) °C.

Unless otherwise defined in this part of ISO 7637, the tolerance on time, resistance and capacitance is ± 10 %.

+10 ⎞
Unless otherwise defined in this part of ISO 7637, the tolerance on voltage is ⎛⎜ ⎟ %.
⎝ 0 ⎠

The supply voltage shall be as shown in Table 2 unless other values are agreed upon by the users of this part
of ISO 7637, in which case such values shall be documented in the test reports.

Table 2 — Test voltages

Nominal system voltage Test voltage

V V

12 13,5 ± 0,5
24 27 ± 1
42 42 ± 1,5

3.3 Ground plane

The ground plane shall be a metallic sheet (e.g. copper, brass or galvanized steel) with a minimum thickness
of 1 mm. The minimum size of the ground plane shall be 2 m × 1 m; however, the final size depends on the
dimensions of the DUT and the test harness. The ground plane shall be connected to the facility earth ground.

3.4 Test set-up

3.4.1 General

The DUT is arranged and connected according to its requirements. The DUT should be connected to the
original operating devices (loads, sensors, etc.) using a test harness or the production wiring harness, as
agreed upon between the vehicle manufacturer and the supplier.

If the actual DUT operating signal sources are not available they may be simulated.

The DUT shall be separated from the ground plane by an insulating support having a thickness of 0,05 m to
0,1 m, unless the DUT case is connected to the chassis and has its own ground connection.

The DUT shall be connected to the grounding system according to the manufacturer's installation
specification; no additional grounding connections are allowed.

Where possible, all loads, sensors, etc. are connected to the ground plane using the shortest possible lead
length.

NOTE To minimize extraneous capacitive coupling to the DUT, it is advisable that the minimum distance between the
DUT and all other conductive structures, such as walls of a shielded room (with the exception of the ground plane
underneath the test set-up), be more than 0,5 m.

3.4.2 Capacitive coupling clamp (CCC) method

The CCC method is suitable for coupling the fast transient test pulses, particularly for DUTs with a moderate
or large number of leads to be tested. It will not couple the slow transient test pulse.

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ISO 7637-3:2007(E)

The test method using the CCC is shown in Figure 1. The coupling circuit consists of a CCC through which all
lines of the DUT are installed as agreed between the vehicle manufacturer and the supplier (excluding or
including the supply lines). The coupling length is 1 m.

The test can be performed either as shown in Figure 1 or with a straight harness as implemented in
ISO 11452-4.

Dimensions in millimetres

Key
1 insulation support (if DUT is not to be connected to the ground in the vehicle)
2 DUT
3 insulating supports for test harness
4 peripheral (e.g. sensors, load, accessories), mounted as in the vehicle
5 ground plane
6 power supply
7 battery
8 oscilloscope
9 50 Ω attenuator
10 CCC
11 test pulse generator

a The selected dimension is specified in the test plan and documented in the test report.

Figure 1 — Test set-up for CCC method

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In the case of the use of a test harness, as specified in this part of ISO 7637, the power supply lines routed
outside the coupling clamp shall have a length of 1 m. The distance between the DUT and the CCC, and
between peripheral devices and the CCC, shall be (400 ± 50) mm. The portions of the lines being tested
which are outside the CCC shall be placed at a distance of (100 ± 20) mm above the ground plane and
oriented 90° ± 15° to the longitudinal CCC axis.

The hinged lid of the CCC shall be placed as flat as possible to ensure contact with the test harness which
should be positioned as flat as possible.

The DUT shall be placed on the same end of the CCC as the pulse generator.

NOTE It is advisable to limit the length of the harness to 2 m in order to improve the reliability of the results.

If using a production harness with a length exceeding 2 m, the wire length should not be coiled, the wire
harness should be positioned as flat as possible and the arrangement shall be specified in the test report. The
maximum distance of 0,45 m between DUT and CCC shall be maintained.

3.4.3 Direct capacitor coupling (DCC) method

The DCC method, using the recommended capacitance value, has been shown to couple the same voltage to
the DUT lines for the fast transient test pulse.

In addition, the DCC method is effective in coupling the slow transient test pulse when the recommended
capacitance value is used.

The DCC method is shown schematically in Figure 2. The length of the harness shall be between 1 000 mm
and 2 000 mm.

When using the DCC method, care shall be taken to ensure that signals are not unacceptably distorted
(e.g. communication on bus systems). The DCC method should not be used on symmetrical lines
(e.g. twisted-pair lines) unless care has been taken to excite all lines identically at the same time
(see Figure 3).

For the fast transient test, the disadvantage of the DCC method is that each line is tested individually.

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ISO 7637-3:2007(E)

Dimensions in millimetres

Key
1 test pulse generator
2 DUT
3 harness
4 ground plane
5 I/O line under test
6 power supply
7 DUT exerciser
8 high-voltage (200 V minimum) ceramic leaded capacitor

NOTE For the value of the capacitor, see Table 3.

a All harnesses are (50 ± 5) mm above ground plane.

Figure 2 — Test set-up for DCC method

Table 3 — Capacitor values for DCC test method

Test pulse Capacitor value

Fast transient test pulse 100 pF

Slow transient test pulse 0,1 µF

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Dimensions in millimetres

Key
1 test pulse generator
2 DUT
3 harness
4 ground plane
5 CAN BUS lines
6 power supply
7 DUT exerciser
8 high-voltage (200 V minimum) ceramic leaded capacitor

a For fast transient test pulse, the recommended capacitor value is 100 pF; and for slow transient test pulse, the
recommended capacitor value is 470 pF.
b The capacitor values are selected to ensure that the communication signals are not disturbed and that the pulses can
still be coupled to these lines.
c All harnesses are (50 ± 5) mm above ground plane.

Figure 3 — Example of DCC test set-up for CAN BUS

3.4.4 Inductive coupling clamp (ICC) method

The ICC method is suitable for coupling the slow transient test pulses, particularly for DUTs with a moderate
or large number of lines to be tested.

The test method using the ICC is shown in Figure 4. The coupling circuit consists of an ICC which enfolds all
signal lines. The DUT power lines (ground and supply) should not be included in the ICC. Any other ground or
supply line delivered by the DUT to an auxiliary equipment (sensors, actuators) shall be included in the ICC. If
the auxiliary equipment is locally grounded, this local ground connection shall be excluded from the ICC. Any
exception about ground or supply lines included in the ICC shall be stated in the test plan.

The test can be performed either as shown in Figure 4 or with a straight harness as implemented in
ISO 11452-4.

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ISO 7637-3:2007(E)

The test conditions for a DUT with multiple connectors (single test on all the branches or test on individual
branch) shall be specified in the test plan.

Key
1 DUT
2 test pulse generator
3 ICC
4 peripheral
5 test harness (length u 2 m)
6 ground line
7 insulation [(50 ± 10) mm]
8 ground plane
9 battery
10 d.c. power supply
11 50 Ω coaxial cable (u 0,5 m)

a The ICC is placed 150 mm from the DUT.

Figure 4 —Test set-up for ICC method

3.5 Application of transient test pulses

3.5.1 CCC method

Using a 50 Ω coaxial cable, the test pulse generator shall be connected to the CCC terminated in a 50 Ω
resistor. The coaxial cable shall be no longer than 1 m.

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The test pulse generator shall be calibrated prior to performance of the test (see Figure 5). The pulse
amplitude is calibrated with an oscilloscope connected to the coupling clamp which is terminated in a 50 Ω
attenuator and 50 Ω oscilloscope. No lines are permitted to route through the coupling clamp during
calibration.

The voltage measurement is made by a 50 Ω oscilloscope connected to a 50 Ω attenuator by a 50 Ω coaxial

cable. The attenuator is used instead of the CCC termination resistor.

Key
1 test pulse generator
2 50 Ω coaxial cable
3 CCC
4 50 Ω attenuator
5 oscilloscope (50 Ω input)

Figure 5 — Set-up for calibration of the test pulse amplitude — CCC method

3.5.2 DCC method

For the DCC method, the characteristics of the pulse generator shall be verified by measuring the open circuit
voltage, followed by measurement of the pulse voltage with the generator terminated in the impedance
appropriate for the pulse as defined in ISO 7637-2.

The output of the generator is connected in series through the coupling capacitor. A high-impedance
oscilloscope should be used to measure the open circuit peak voltage at the output end of the capacitor. The
generator output shall be adjusted to achieve the test level.

3.5.3 ICC method

The test pulse generator shall be connected to the inductive coupling clamp with a cable or cables no longer
than 0,5 m.

In contrast to the CCC and DCC methods, the ICC method does not use the open circuit voltage of the pulse
generator to specify the test level. Rather, the ICC method specifies the test level as the output voltage
measured with the calibration test set-up defined in Figure 6. The coupled pulse shall fulfil the requirements of
4.6. See Annex C for information on the process used for estimating the inductive coupling factor.

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ISO 7637-3:2007(E)

Key
1 test pulse generator
2 oscilloscope (1 MΩ input)
3 ICC
4 short circuit
5 calibration fixture
6 50 Ω coaxial cable

NOTE See Annex A for an example of the calibration fixture used for the ICC test method.

Figure 6 — Test set-up for ICC calibration

4 Test instrument description and specification

4.1 Power supply

The power supply defined in ISO 7637-2 shall be used for these tests.

4.2 Oscilloscope

The oscilloscope and probes defined in ISO 7637-2 shall be used for these tests.

4.3 Test pulse generator

4.3.1 General

The test pulse generator shall be capable of producing the test pulses shown in Figures 7, 8, 9, and 10 and
shall be adjustable within the limits given in the figures.

The pulse generator of ISO 7637-2 shall be used and the wave shapes shall be verified according to
ISO 7637-2.

4.3.2 Fast transient test pulses a and b

The fast transient test pulses are a simulation of transients which occur as a result of the switching processes.
The characteristics of these transients are influenced by distributed capacitance and inductance of the wiring
harness.

The pulse shapes and parameters are given in Figures 7 and 8.

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Key
t time
U tension, in volts

Parameters 12 V system 24 V system 42 V system

Us in V See Table B.1 See Table B.2 See Table B.3

tr in ns 5 5 5

td in µs 0,1 0,1 0,1

t1 in µs 100 100 100

t4 in ms 10 10 10

t5 in ms 90 90 90

Ri in Ω 50 50 50

Figure 7 — Fast transient test pulse a

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ISO 7637-3:2007(E)

Key
t time
U tension, in volts

Parameters 12 V system 24 V system 42 V system

Us in V See Table B.1 See Table B.2 See Table B.3

tr in ns 5 5 5
td in µs 0,1 0,1 0,1
t1 in µs 100 100 100
t4 in ms 10 10 10
t5 in ms 90 90 90
Ri in Ω 50 50 50

Figure 8 — Fast transient test pulse b

4.3.3 Slow transient test pulses

The slow transient test pulses are a simulation of transients which occur as a result of breaking the circuit to
larger inductive loads, such as a radiator fan motor, air conditioning compressor clutch, etc.

The pulse shapes and parameters are given in Figures 9 and 10.

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Key
t time
U tension, in volts

Parameters

Us To be defined in test plan

tr u1 µs
td 0,05 ms
t1 0,5 s to 5 s
Ri 2Ω

Figure 9 — Slow transient test pulse — Positive

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ISO 7637-3:2007(E)

Key
t time
U tension, in volts
Parameters

Us To be defined in test plan

tr u1 µs
td 0,05 ms
t1 0,5 s to 5 s
Ri 2Ω

Figure 10 — Slow transient test pulse — Negative

4.4 Capacitive coupling clamp

The CCC provides the means of coupling the test pulses into the circuit under test without any galvanic
connection to the DUT, wiring harness and/or auxiliary equipment.

The CCC coupling efficiency depends on the diameter and the material of the cables.

The CCC, as defined in Figure 11, can be made, for example, of brass, copper or galvanized steel.

Both ends of the CCC shall be equipped with a 50 Ω coaxial connector.

The recommended test set-up using the CCC is shown in Figure 1.

The characteristics of the CCC are as follows:

⎯ typical coupling capacitance between cable and clamp: about 100 pF (200 pF maximum);

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⎯ applicable diameter range of harness: 4 mm to 40 mm;

⎯ pulse voltage insulation strength: W 200 V;

⎯ impedance (without wires in the clamp): (50 ± 5) Ω.

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ISO 7637-3:2007(E)

Dimensions in millimetres

Key
1 insulating material 2 hinge
Figure 11 — Capacitive coupling clamp

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4.5 Direct coupling capacitor

A non-polarized capacitor with a voltage rating of at least twice the maximum applied voltage shall be used.
The value of the capacitance shall be as shown in Table 2 with a tolerance of ± 10 %.

4.6 Inductive coupling clamp

The ICC is a bulk current injection (BCI) probe with special characteristics. It provides the means of coupling
the test pulses into the circuit under test without any galvanic connection to the DUT, wiring harness and/or
auxiliary equipment. The pulses, as described in Figures 9 and 10, applied to the injection probe and then
measured in the calibration test set-up (see Figure 6) shall fulfill the requirements stated in Table 4.

Table 4 — ICC — Characteristics of the coupled pulses

Parameters 12 V system 24 V system 42 V system

td in µs (7 ± 30) % (7 ± 30) % (7 ± 30) %

tr in µs u 1,2 u 1,2 u 1,2

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ISO 7637-3:2007(E)

Annex A
(normative)

Calibration fixture used for the ICC test method

Figure A.1 shows an example of a calibration fixture used for the ICC test method. The physical size of the
calibration fixture shall be compatible with the injection probe to be calibrated.

Key
1 insulation
2 removable metal cover
3 current injection probe
4 coaxial connector

Figure A.1 — Example of calibration fixture (jig)

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Annex B
(informative)

Example of test severity levels associated with functional

performance status classification

B.1 General
This annex provides examples of test severity levels which should be used in line with the principle of
functional performance status classification (FPSC) described in ISO 7637-1.

B.2 Classification of test pulse severity level

The values given for all three methods for 12 V systems and for fast transient for 24 V systems are based on
considerable experience. The values given for 42 V system are extrapolated from very limited experience. As
experience is accumulated with 24 V and 42 V systems, the tables concerned will be updated.

The suggested minimum and maximum severity levels are given in columns I and IV of Tables B.1 to B.3.

A test level and test time at or in between these values may be selected according to the agreement between
vehicle manufacturer and supplier. In cases where no specific values are defined, it is recommended to use
levels selected from columns I to IV in Tables B.1 to B.3.

The recommended test severity levels for a 12 V electrical system are given in Table B.1.

Table B.1 — Recommended test severity levels for a 12 V electrical system

Test levels Us c

Selected test V Test time

Test pulse a
level b min
I II III IV
min. max.

Fast a (DCC and CCC) − 10 − 20 − 40 − 60 10

Fast b (DCC and CCC) + 10 + 20 + 30 + 40 10
DCC slow + +8 +15 + 23 + 30 5
DCC slow − −8 − 15 − 23 − 30 5
ICC slow + +3 +4 +5 +6 5
ICC slow − −3 −4 −5 −6 5
a Test pulses as in 4.3.
b Values agreed to between vehicle manufacturer and supplier.
c The amplitudes in the table are the values of Us, as defined for each test pulse in 4.3. Us is referenced at the output of the CCC for
the CCC method, or at the output of the open circuit generator for the DCC method.

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ISO 7637-3:2007(E)

The recommended test severity levels for a 24 V electrical system are given in Table B.2.

Table B.2 — Recommended test severity levels for a 24 V electrical system

Test levels Us c

Selected test V Test time

Test pulse a
level b min
I II III IV
min. max.
Fast a (DCC and CCC) − 14 − 28 − 56 − 80 10
Fast b (DCC and CCC) + 14 + 28 + 56 + 80 10
DCC slow + + 15 +25 + 35 + 45 5
DCC slow − − 15 − 25 − 35 − 45 5
ICC slow + +4 +6 +8 + 10 5
ICC slow − −4 −6 −8 − 10 5
a Test pulses as in 4.3.
b Values agreed to between vehicle manufacturer and supplier.
c The amplitudes in the table are the values of Us, as defined for each test pulse in 4.3. Us is referenced at the output of the CCC for
the CCC method, or at the output of the open circuit generator for the DCC method.

The recommended test severity levels for a 42 V electrical system are given in Table B.3.

Table B.3 — Recommended test severity levels for a 42 V electrical system

Test levels Us c

Selected test V Test time

Test pulse a
level b I II III IV min

min. max.

− 10 − 20 − 40 − 60
Fast a (DCC and CCC) 10
(− 20) (− 40) (− 80) (− 120)
+ 10 + 20 + 30 + 40
Fast b (DCC and CCC) 10
(+ 20) (+ 40) (+ 60) (+ 80)
DCC slow + +8 +15 + 23 + 30 5

DCC slow − −8 −15 − 23 − 30 5

ICC slow + +3 +4 +5 +6 5

ICC slow − −3 −4 −5 −6 5
a Test pulses as in 4.3.
b Values agreed to between vehicle manufacturer and supplier.
c The amplitudes in the table are the values of Us, as defined for each test pulse in 4.3. Us is referenced at the output of the CCC for
the CCC method, or at the output of the open circuit generator for the DCC method.

NOTE In testing the device to increasing test pulse severity, care would need to be taken to avoid possible
cumulative effects from the previous test.

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B.3 Example of FPSC application using test pulse severity levels

An example of severity levels is given in Table B.4. The values can vary depending on the kind of pulse and
the type of electrical system, 12 V, 24 V or 42 V (see levels from Tables B.1 to B.3).

Table B.4 — Example of FPSC application using test pulse severity levels

Category 1 Category 2 Category 3

L4i Level II Level III Level IV

L3i Level II Level III Level III

L2i Level II Level II Level III

L1i Level I Level I Level II

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ISO 7637-3:2007(E)

Annex C
(informative)

Estimation of the inductive coupling factor

The estimation of inductive coupling factor, k, requires the use of the wire harness classification in Table C.1.

Table C.1 — Wire harness classification used in Figure C.1

Wire harness diameter, d

Set
mm

d u 11 B11

11 < d u 15 B15

15 < d u 20 B20

20 < d u 25 B25

25 < d u 30 B30

30 < d u 35 B35

The common path of lines within a wire harness defines the coupling network. The coupling factor, k, depends
on the parameter of the wire harness diameter (see Figure C.1).

Key
X coupling network length, in centimetres
Y inductive coupling factor, k

Figure C.1 — Dependence between the inductive coupling factor, k, the coupling network length and
the diameter of the wire harness in the case of slow transient test pulses

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 ISO 7637-3:2007(E)

The peak interference voltage (test voltage), Utest, is defined in the following equation:

U test = k × U switchoff

where

k is the inductive coupling factor as shown in Figure C.1;

Uswitchoff is the peak voltage produced by a switch-off event.

The peak interference voltage, Utest, can be used as an estimated test severity level needed for a special
configuration. Using the procedure described in 3.5.3, the generator output voltage (open circuit voltage) can
be derived from it.

© ISO 2007 – All rights reserved 23

ISO 7637-3:2007(E)

Bibliography

[1] ISO 7637-1, Road vehicles — Electrical disturbances from conduction and coupling — Part 1:
Definitions and general considerations

[2] ISO 11452-4, Road vehicles — Component test methods for electrical disturbances from narrowband
radiated electromagnetic energy — Part 4: Bulk current injection (BCI)

24 © ISO 2007 – All rights reserved

ISO 7637-3:2007(E)

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© ISO 2007 – All rights reserved